SIMS Europe 2023

European Workshop on Secondary Ion Mass Spectrometry

Nottingham, UK | September 3 - 5, 2023

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Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

Please note that all times are shown in the time zone of the conference. The current conference time is: 15th May 2024, 10:23:18am BST

Session Overview
Location: ESCL A09 Engineering & Science Learning Centre (ESLC) University Park, Building 54 Nottingham

Date: Monday, 04/Sept/2023

2:05pm
-
3:25pm

Session 2-3: Inorganic / Depth Profiling 1
Location: ESCL A09

2:05pm - 2:25pm

Zirconia nanotubes as a potential tool for controlled drug release in implant systems

Gabriel Onyenso, Manuela Killian

Universität Siegen, Germany

2:25pm - 2:45pm

Oxygen detection limit improvement for dynamic SIMS and TOF-SIMS

Alexandre Merkulov, Alexis Franquert

IMEC, Belgium

2:45pm - 3:05pm

ToF-SIMS analyses in an H₂ atmosphere: Improvements in depth profiling and reduction of matrix effect

Jernej Ekar^1,2, Janez Kovač¹

1: Jožef Stefan Institute, 1000 Ljubljana, Slovenia; 2: Jožef Stefan International Postgraduate School, 1000 Ljubljana, Slovenia

3:05pm - 3:25pm

Multi-energy proton implantation in silicon: challenges in dynamic-SIMS hydrogen depth profiling

Orazio Samperi¹, Lasse Vines², Mario Pietro Bertolini³, Massimiliano Cantiano³, Salvatore Coffa³, Maria Elena Fragalà¹

1: University of Catania, Italy; 2: University of Oslo, Norway; 3: STMicroelectronics Catania, Italy

4:00pm
-
5:20pm

Session 3-3: Inorganic / Depth Profiling 2
Location: ESCL A09

4:00pm - 4:20pm

Alkali Ion Transport in Lithium Borate Glass: New Insights into the Site Energy Distribution from CAIT/ToF-SIMS experiments and theory

Karl-Michael Weitzel¹, Victor Gunawan¹, Marco Bosi², Martin Schäfer¹, Philipp Maass²

1: Philipps-Universität Marburg, Germany; 2: Universität Osnabrück, Germany

4:20pm - 4:40pm

Structurally ‘smart’ implants: Imparting micro-nanoscale coatings to bulk-ceramics

Swathi Naidu Vakamulla Rgahu¹, Patrick Hartwich¹, Adam Patalas², Manuela Sonja Killian¹

1: University of Siegen, Germany; 2: Poznan University of Technology, Poznan, Poland

4:40pm - 5:00pm

OrbiSIMS characterisation: Low energy depth profiling of semiconductor materials - depth resolution and sensitivity

Yundong Zhou¹, Alexis Franquet², Valentina Spampinato^2,3, Gustavo F. Trindade¹, Alex Merkulov², Paul van der Heide², Wilfried Vandervorst², Ian Gilmore¹

1: National Physical Laboratory, Hampton Rd, Teddington TW11 0LW, UK; 2: IMEC, Kapeldreef 75, 3001 Leuven, Belgium; 3: Università degli Studi di Catania, Dipartimento di Scienze Chimiche, Viale A. Doria 6, 95125 Catania, Italy

5:00pm - 5:20pm

Investigation of atomic-scale decorations on mixed conductive materials by Time-of-flight secondary ion mass spectrometry (ToF-SIMS)

Florian Fahrnberger¹, Siebenhofer Matthäus^1,2, Herbert Hutter¹, Markus Kubicek¹

1: Institute of Chemical Technologies and Analytics, TU Wien, Austria; 2: CEST Centre of Electrochemistry and Surface Technology, Wr. Neustadt, Austria

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