Evolution and revolution in SIMS

Ian Gilmore

NPL London, United Kingdom

From Raw Materials to Full Cells: What SIMS Can Do in Battery Research

Anja Henss, Timo Weintraut, Kilian Vettori, Steffen Schröder, Burak Aktekin, Jürgen Janek

Institute of Physical Chemistry and Center for Material Research, Justus-Liebig-University of Giessen, Germany

Enhancing Surface Reactivity of Anatase TiO₂ via Metal-Phosphate Bilayers

Setareh Orangpour, Swathi Naidu Vakamulla Raghu, Shiva Mohajernia, Manuela S. Killian

Siegen universität, Germany

Unveiling lithium ion diffusion pathways in PEO/LLZO composite electrolyte by in-situ ToF-SIMS imaging of ⁶lithium movement in cell cross sections

Timo Weintraut, Juri Becker, Anja Henss

Institute of Physical Chemistry and Centre for Materials Research, Justus Liebig University Giessen, Germany

Characterization of Battery Material Using Surface Science Techniques

Abdulrhman H. Alsaedi, Alex S. Walton, Nick P. Lockyer

Photon Science Institute, Department of Chemistry, University of Manchester, Oxford Rd., Manchester M13 9PL, U.K.

Chemical degradation analysis on the interface of LiNi_0.8Mn_0.1Co_0.1O₂ cathode materials

Zonghao Shen^1,2, Richard Chater², Ainara Aguadero^2,3

1: Univ. Grenoble Alpes, CNRS, Grenoble INP, LMGP, Grenoble 38000, France; 2: Department of Materials, Imperial College London, Exhibition Road, London, SW7 2AZ, United Kingdom; 3: Instituto de Ciencia de Materiales de Madrid ICMM-CSIC, Spain

Machine learning on 3D data sets: Untangling complex spectral patterns

Sarah Elizabeth Bamford¹, Paul James Pigram¹, Wil Gardner¹, Ben Ward Muir², David A Winkler¹, Dilek Yalcin³, Thomas Kohl²

1: La Trobe University, Australia; 2: CSIRO Melbourne, 3168, Australia; 3: Ege University, Izmir, Turkey

Inverse Maximum Signal Factors Denoising: A Versatile Tool for Mass Spectrometry Image Analysis

Bonnie J Tyler, Heinrich F. Arlinghaus

University of Muenster, Germany

OrbiSIMS: Linearity of the intensity scale and implications in depth profiling and imaging

Gustavo F. Trindade¹, Michael R. Keenan², Ian S. Gilmore¹

1: National Physical Laboratory, United Kingdom; 2: Independent

A comparative study of ¹⁸O behavior in formation of anodic alumina films by complementary techniques: nuclear reaction analysis and mass spectrometry

Aleksandra Baron-Wiechec, Guocong Lin, Ruojia Zhang

Guangdong Technion - Israel Institute of Technology, China, People's Republic of

Imaging the stratigraphy on a Roman polychrome colossal statue coated with waxes using Time-of-Flight Secondary Ion Mass Spectrometry

Caroline Bouvier^1,2, Elisabetta Neri³, Nesrine Nasr⁴, Fathi Bejaoui⁴, François Baratte⁵, Philippe Walter², Alain Brunelle²

1: Scientific Laboratory of the Bibliothèque nationale de France (BnF), Bibliothèque nationale de France, Bussy-st-Georges, France; 2: Sorbonne Université, CNRS, Laboratoire d'Archéologie Moléculaire et Structurale (LAMS UMR 8220), Paris, France; 3: Centre Européen d'Archéométrie, U.R. Art, Archéologie et Patrimoine, IPNAS, Sart Tilman B15, Université de Liège, 4000 Liège, Belgium; 4: INP-Tunis, Institut National du Patrimoine (INP), 04, place du château, Tunis 1008, Tunisia; 5: Sorbonne Université, CNRS, Orient & Méditerranée, UMR 8167, Paris, France

A Study of the Use of Polyethylene Glycol (PEG) for the Conservation of The Mary Rose Ship

Marie-Laure Odile Abel¹, Anna Kotowska², Alastair Miles³, John Farnham Watts¹

1: University of Surrey, UK; 2: University of Nottingham, UK; 3: The Mary Rose Trust, Portsmouth, UK

From SIMS to RIMS: Element selective isotope analysis on hot particles from the Chornobyl Exclusion Zone

Darcy van Eerten¹, Manuel Raiwa², Paul Hanemann¹, Laura Leifermann¹, Tobias Weissenborn¹, Martin Weiss¹, Wolfgang Schulz¹, Danielle Ziva Shulaker², Peter Boone², David Willingham², Keenan Thomas², Brian Sammis², Brett Isselhardt², Mike Savina², Clemens Walther²

1: Institut für Radioökologie und Strahlenschutz, Leibniz Universität Hannover, Germany; 2: Nuclear and Chemical Sciences Division, Lawrence Livermore National Laboratory, Livermore, USA

Soft (bio)molecule desorption and transfer for enhanced mass spectrometric analysis and solvent-free multilayer buildup

Arnaud Delcorte, Vincent Delmez, Thomas Daphnis, Benjamin Tomasetti, Samuel Bertolini, Christine Dupont-Gillain

Institute of Condensed Matter and Nanoscience, Université catholique de Louvain, Belgium.

Benchmarking 3D-OrbiSIMS for Structural Modelling of Native Biomolecular Complexes

Aditi N Borkar, Ceri Staley, Anna Kotowska, Christopher Waugh, Shannon Ward, Julie Watts

University of Nottingham, United Kingdom

Soft landing simulations of lysozymes desorbed by argon cluster bombardment

Samuel Bertolini, Arnaud Delcorte

Universite Catholique de Louvain, Belgium

Evaluating the Effect of Water Overlayer on Sputtering of Trehalose by Water Cluster Projectiles – Computer Simulations Study

Michał Jakub Kański, Zbigniew Postawa

Jagiellonian University, Faculty of Physics, Astronomy and Applied Computer Science, Smoluchowski Institute of Physics, Łojasiewicza 11, 30-348 Kraków, Poland

Correlative TOF-SIMS/SEM imaging of photosynthetic organisms

Claire Seydoux, Pierre-Henri Jouneau, Jean-Paul Barnes

CEA Grenoble, France

Combined ToF-SIMS and C-AFM characterization on WS₂ 2D transition metal dichalcogenide layers

Valentina Spampinato^1,3, Yuanyuan Shi^2,3, Jill Serron³, Albert Minj³, Benjamin Groven³, Thomas Hantschel³, Paul van der Heide³, Alexis Franquet³

1: Università degli Studi di Catania, Italy; 2: School of Microelectronics, University of Science and Technology of China, Hefei, China; 3: IMEC, Kapeldreef 75, 3001 Leuven, Belgium

Trends and prospects of Focused Ion Beam platforms coupled with SIMS systems

Jean-Nicolas Audinot, Patrick Philipp, Olivier De Castro, Antje Biesemeier, Hung Quang Hoang, Tom Wirtz

Luxembourg Institute of Science and Technology, Luxembourg

Production of synthetic homogenous U-Pu samples for determination of rL-SNMS suppression rates

Paul Hanemann, Stefan Bister, Manuel Raiwa, Sandra Reinhard, Darcy van Eerten, Aaron Lehnert, Clemens Walther

Institute of Radioecology and Radiation Protection, Leibniz Universität Hannover, Germany

Atomic depth resolution for atomically thin materials

Paweł Piotr Michałowski

Łukasiewicz Research Network - Institute of Microelectronics and Photonics, Poland

Insights on OLED degradation mechanisms by correlative TOF-SIMS and XPS

Claire Guyot, Jean-Paul Barnes, Olivier Renault, Tony Maindron

Univ. Grenoble Alpes, CEA, Leti, F-38000, Grenoble, France

ToF-SIMS Surface Analysis of Stains on Bond Pads and Passivation layer – key enabler to identify the contamination source to prevent reoccurrence

Patrick Rostam-Khani, Jos Philipsen, Shreya Nandi

NXP Semiconductors, The Netherlands

Exploring additively manufactured heterostructures of functional materials: focus on interfaces

Jonathan Austin¹, Feiran Wang¹, Negar Gilani¹, Yundong Zhou², Gustavo F. Trindade², Ian Gilmore², Christopher J. Tuck¹, Richard J.M. Hague¹, Ricky D. Wildman¹, Lyudmila Turyanska¹, Geoffrey Rivers¹

1: Centre for Additive Manufacturing, Faculty of Engineering, University of Nottingham, Nottingham, NG8 1BB, UK; 2: National Centre of Excellence in Mass Spectrometry Imaging, National Physical Laboratory, Teddington, TW11 0LW, UK

The Utility of Surface-Induced Dissociation in Molecular Identification

Gregory Lawrence Fisher¹, Shin-ichi Iida²

1: Physical Electronics, United States of America; 2: ULVAC-PHI, Japan

Development of Novel High Energy Cluster Ion Beam Methodology for Molecular Analysis and Imaging

Matija Lagator, Sadia Sheraz, Nicholas P. Lockyer

The University of Manchester, United Kingdom

Automated Unattended TOF-SIMS Analysis of Insulator Samples using PHI nanoTOF3

Shin-ichi Iida¹, Gregory Fisher²

1: ULVAC-PHI, Japan; 2: Physical Electronics, USA