Index of Authors

A list of all persons who contribute to the sessions of this conference. Please select a letter below to list all persons with the corresponding last name. Select the presentation in the right-hand column to access session and presentation details.

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Author(s) Organization(s) Session
Abao, Victore AnandUniversity of the Philippines Diliman, PhilippinesInteractive Poster Session
Abdalla, Omer Mohamed OsmanDepartment of Civil and Environmental Engineering, Politecnico di Milano, Italy.Ultrasound Devices
Abdelwahab, AhmedDelft University of Technology (TU Delft), Netherlands, ECTMInteractive Poster Session  Presenter
Abdul Kareem, Razia SulthanaUniversity of Greenwich, United KingdomMirelai Session
Abo Ras, MohamadBerliner Nanotest und Design GmbH, GermanyInteractive Poster Session
Interactive Poster Session
Interactive Poster Session
Thermal Experimental Characterization
Acero, JesusUniversidad de Zaragoza, SpainInteractive Poster Session
Adolfsson, ErikRISE Research Institutes of Sweden, SwedenInteractive Poster Session
AITAYAD, RedaUniv. Polytechnique Hauts-de-France, FranceMEMS Sensors
Akbari, SaeedRISE Research Institutes of Sweden, SwedenInteractive Poster Session  Presenter
Albrecht, JanFraunhofer ENAS, Chemnitz, Germany;
Fraunhofer Institute for Electronic Nano Systems (ENAS);
Fraunhofer ENAS, Micro Materials Center;
Technical University of Chemnitz, Center for Micro and Nanotechnologies
Interconnect Degradation
Machine Learning-based Methods
Material Modeling for Packaging
Alincant, DavidCEA LETI, FranceUltrasound Devices
Alkurdi, MohamedUniversité Paris-Saclay, France;
Centre national de la recherche scientifique (CNRS), France;
Satie Lab, France
Interactive Poster Session  Presenter
Altieri-Weimar, PaolaInfineon Technologies AG, GermanyInteractive Poster Session
Antonietti, PaolaMOX, Dipartimento di Matematica, Politecnico di Milano, Italy.Ultrasound Devices
Antretter, ThomasMontanuniversität Leoben, AustriaInteractive Poster Session
Interconnect Degradation
ARATI, BaptisteIRT Saint Exupéry, France.Interconnect Degradation
Arnold, JoergTU Chemnitz, GermanyThermal Experimental Characterization
Ayaz, MahamChemnitz University of Technology, Germany;
TU Chemnitz, Germany
Interactive Poster Session
Bailey, ChristopherArizona State University - Tempe, USAAdvanced Packaging Reliability
Bailey, ChristopherArizona State University, United States of AmericaInteractive Poster Session
Barkur, DharshanRobert Bosch GmbH, GermanyMission Profiles & RUL
Barry-Martinet, RaphaelleMAPIEM, University of Toulon, FranceAdvanced MEMS
Basbas, Hannah IsabelUniversity of the Philippines Diliman, PhilippinesInteractive Poster Session
Baumgartl, HannaCADFEM Germany GmbH, GermanyMission Profiles & RUL
Bausen, AndreBundeswehr Research Institute for Protective Technologies and CBRN Protection (WIS), GermanyInteractive Poster Session
Bechtold, TamaraJade University of Applied Sciences, Germany;
University of Rostock, Germany;
CADFEM Germany GmbH, Germany
Advanced Simulation Methods
Digital Twins & Model Exchange
MEMS Sensors
Becker, Karl-FriedrichFraunhofer IZM , GermanyThermal Experimental Characterization
Behl, ChristianFhI ENAS, GermanyMEMS Sensors
Bejani, MehdiPolitecnico di Milano, Italy;
Technoprobe, Italy
Interactive Poster Session  Presenter
Interactive Poster Session  Presenter
BEN ABDELKADER, MakremUniv. Polytechnique Hauts-de-France, France;
NANOMISENE Laboratory, Tunisia;
University of Sousse, Tunisia
MEMS Sensors  Presenter
Ben Dhiab, AyoubCEA LIST, FranceUltrasound Devices
Bergman, OleDelft Universtiy of Technology, The NetherlandsPCB Reliability
Bergmann, Ole J.Delft University of Technology, The NetherlandsMission Profiles & RUL  Presenter
Betak, Petronsemi, Central Engineering, Oudenaarde, Belgium; Roznov pod Radhostem, Czech Republic; Sunnyvale, CA, USAMultiphysics Simulation for Packaging
Bharamgonda, AniketUniversity of Maryland, USA;
University of Maryland, United States of America
Advanced Packaging Reliability
Interactive Poster Session
Interactive Poster Session
Bock, KarlheinzTechnische Universität Dresden, GermanyInteractive Poster Session
Boldeiu, GeorgeNational Institute for Research and Development in Microtechnologies (IMT), RomaniaInteractive Poster Session
Boone, MatthieuCentre for X-ray Tomography, Ghent UniversityInteractive Poster Session
Bornoff, RobinSiemens Digital Industries SoftwareMirelai Session
Bose, AbantikaFraunhofer IISB, GermanyMission Profiles & RUL  Presenter
Bouarroudj, MouniraSatie Lab, France;
Université Gustave Eiffe, France
Interactive Poster Session
Bouarroudj, MouniraSATIE, Gustave Eiffel University, FranceMaterial Modeling for Packaging
Boukerma, KadaIFREMER, FranceAdvanced MEMS
Bouville, DavidC2N-UPSACLAY, FranceInteractive Poster Session
Braun, SilviaFraunhofer Institute for Electronic Nano Systems, GermanyThermal Design Modeling and Experimental Characterization
Bressy, ChristineMAPIEM, University of Toulon, FranceAdvanced MEMS
Bretthauer, ChristianInfineon Technologies AG, GermanyAdvanced MEMS
Interactive Poster Session
MEMS Sensors
Briand, Jean-francoisMAPIEM, University of Toulon, FranceAdvanced MEMS
Brisset, HuguesMAPIEM, University of Toulon, FranceAdvanced MEMS
Busse, Dirkbudatec GmbH,12487 Berlin, GermanyInteractive Poster Session
CAMPS, JOSÉPower electronics Llíria, SpainMultiphysics Simulation for Packaging
Cano Castro, SofiaInfineon Technologies Austria AG, Austria;
ETH Zurich, Switzerland
Advanced MEMS
Cao, LiqiangChinese Academy of Sciences, ChinaMaterials Modelling
Caponi, DamianoSilicon Austria Labs GmbH, AustriaMultiphysics Simulation for Packaging  Presenter
CARLIER, JulienUniv. Polytechnique Hauts-de-France, FranceMEMS Sensors
Casselle, Michele2Karlsruhe Institute of Technology (KIT), GermanyInteractive Poster Session
Casset, FabriceCEA-Leti, FranceAdvanced MEMS  Presenter
Ultrasound Devices
Catalano, Antonio PioUniversity of Naples Federico II, Italy;
University of Naples "Federico II", Italy
Interactive Poster Session  Presenter
Multiphysics Simulation for Packaging
Thermal Design Modeling and Experimental Characterization
Cauwe, Maartenimec, BelgiumPCB Reliability
Chan, H.-Y.National Taiwan University, TaiwanInteractive Poster Session
Chang, Chia-EnNational Tsing Hua University, TaiwanInteractive Poster Session  Presenter
Chedozeau, ClémentUniversité Paris-Saclay, France;
Mitsubishi Electric R&D Centre Europe, France
Materials Modelling  Presenter
Chen, CWSupermicor, TaiwanIEEE EPS Distinguished Lectures
Chen, JueSchweizer Electronic AG, GermanyPCB Reliability
Chiang, Kuo-NingNational Tsing Hua University, TaiwanInteractive Poster Session
Interactive Poster Session
Interactive Poster Session
Choudhury, PadmanavaAuburn University, United States of AmericaMold & interface Materials
Cirulis, ImantsFraunhofer ENAS, GermanyMold & interface Materials
Co, Jericho KentUniversity of the Philippines Diliman, PhilippinesInteractive Poster Session
COCCETTI, FabioIRT Saint Exupéry, France.Interconnect Degradation
Coclite, Anna MariaUniversity of Bari, ItalyInteractive Poster Session
Colin, MikaelCEA-Leti, FranceAdvanced MEMS
Ultrasound Devices
Conrad, JanineFraunhofer IZM, GermanyPCB Reliability  Presenter
Corigliano, AlbertoDepartment of Civil and Environmental Engineering, Politecnico di Milano, Italy.Ultrasound Devices
COUGO, BernardoIRT Saint Exupéry, France.Interconnect Degradation
Czarnecki, Piotrimec, BelgiumMachine Learning-based Methods
D. van Driel, WillemDelft University of Technology, Netherlands, TheMachine Learning-based Methods
d'Alessandro, VincenzoUniversity of Naples Federico II, ItalyInteractive Poster Session
d'Alessandro, VincenzoUniversity of Naples "Federico II", ItalyMultiphysics Simulation for Packaging
DAHMANI, HatemUniv. Polytechnique Hauts-de-France, FranceMEMS Sensors
Daliento, SantoloUniversity of Napoli Federico II, ItalyThermal Design Modeling and Experimental Characterization
Dasgupta, AbhijitUniversity of Maryland, USA;
University of Maryland, United States of America
Advanced Packaging Reliability
Interactive Poster Session  Presenter
Interactive Poster Session
Interactive Poster Session  Presenter
de Bruin, EmielBoschman Technologies B.V.,The NetherlandsMaterials Modelling
De Gregoriis, DanielSiemens Digital Industries SoftwareMirelai Session
de Jong, Sjoerd D.MDelft University of Technology, The NetherlandsAdvanced Simulation Methods  Presenter
De Leon, Maria TheresaUniversity of the Philippines, Philippines;
University of the Philippines Diliman, Philippines
Interactive Poster Session
Interactive Poster Session
De Paola, Francescoonsemi, Analog and Mixed-Signal Group, Milan, ItalyMultiphysics Simulation for Packaging
De Riso, MonicaUniversity of Napoli Federico II, ItalyThermal Design Modeling and Experimental Characterization
Delattre, GallienCEA-Leti, FranceAdvanced MEMS
Demuth, NilsTechnische Universität Darmstadt, GermanyAdvanced MEMS
Deng, YongboInstitute of Microstructure Technology (IMT), Karlsruhe Institute of Technology (KIT), GermanyAdvanced Simulation Methods  Presenter
Depaola, Matteoimec;
Siemens Digital Industries Software;
KU Leuven
Mirelai Session  Presenter
Dinescu, SebastianMAPIEM, University of Toulon, FranceAdvanced MEMS
Ding, Bo-RuiNational Formosa University, TaiwanAdvanced Packaging Reliability
Ding, FeiChinese Academy of Sciences, ChinaMaterials Modelling
Ding, XuanyuPeking University. ChinaMaterials Modelling
Dogiamis, GeorgeDeca Technologies, United States of AmericaInteractive Poster Session
Dörsam, Jan HelgeTechnische Universität Darmstadt, GermanyAdvanced MEMS
Dreanno, CatherineIFREMER, FranceAdvanced MEMS
DRIDI, ChérifNANOMISENE Laboratory, TunisiaMEMS Sensors
Dudek, RainerFraunhofer ENAS, Chemnitz, GermanyInterconnect Degradation  Presenter
DUPONT, SamuelUniv. Polytechnique Hauts-de-France, FranceMEMS Sensors
Egan, VanessaUniversity of Limerick, IrelandThermal Design Modeling and Experimental Characterization
Eliseo, GiorgioUniversity of Naples "Federico II", Italy;
onsemi, Analog and Mixed-Signal Group, Milan, Italy
Multiphysics Simulation for Packaging  Presenter
Erden, Oguz KaanImec, Leuven, Belgium;
KU Leuven, Belgium
Ultrasound Devices  Presenter
Eyert, VolkerMaterials Design SARL, FranceInteractive Poster Session  Presenter
Faes, JanaDepartment of Materials, Textiles and Chemical Engineering (MaTCh), Ghent UniversityInteractive Poster Session  Presenter
Fahim, AbdullahNXP Semiconductors, USAInteractive Poster Session
Fan, JiajieDelft University of Technology (TU Delft), Netherlands, ECTM;
Delft University of Technology, The Netherlands;
Fudan University, China
Interactive Poster Session
Interactive Poster Session
Materials Modelling
Fan, XuejunLamar University, United States of AmericaIEEE EPS Distinguished Lectures  Presenter
Farmani, ZohrehDelft University of Technology (TU Delft), Netherlands, PMEInteractive Poster Session
Fendt, KarlAustria Technologie & Systemtechnik AGMachine Learning-based Methods
Ferrie, PatriciaMaterials Consultancy Services Limited, Midlothian Innovation Centre, ScotlandMirelai Session
Feuchter, MikeCADFEM Germany GmbH, GermanyMission Profiles & RUL  Presenter
Forke, RomanFhI ENAS, GermanyMEMS Sensors
FRADIN, Jean-PierreIcam School of Engineering, France.Interconnect Degradation
Frangi, AttilioDepartment of Civil and Environmental Engineering, Politecnico di Milano, Italy.Ultrasound Devices
Franiatte, RémiCEA LETI, FranceUltrasound Devices
Friebe, TilTechnical University of Munich, GermanyMEMS Sensors
Fruehauf, PeterSiemens AG, Technology, Berlin, GermanyInterconnect Degradation
Fuchs, Peter FillipPolymer Competence Center Leoben GmbH (PCCL), GermanyDigital Twins & Model Exchange
Interactive Poster Session
Solder Fatigue: Models & Mechanisms
Interactive Poster Session
Gagic, MladenTU Delft, The NetherlandsThermal Behavioral Modeling
Gallarday, PierreInstitute of Microelectronics of Barcelona (IMB-CNM-CSIC), SpainInteractive Poster Session  Presenter
Gandhi, RohitArizona State University - Tempe, USA;
Arizona State University, United States of America
Advanced Packaging Reliability  Presenter
Interactive Poster Session
Gao, ChenShanSouthern University of Science and Technology. ChinaChiplets & Warpage
Garroni, Michelangelo GabrieleMOX, Dipartimento di Matematica, Politecnico di Milano, Italy.Ultrasound Devices  Presenter
Geisler, Lukasams-OSRAM International GmbH, GermanyAdvanced Packaging Reliability
George, BrindaInfineon Technologies AG Munich, GermanyMaterial Modeling for Packaging  Presenter
Gheytaghi, Amir MirzaAmpleon B.V.Thermal Experimental Characterization  Presenter
GIRARD, GautierUniversité de Lorraine, France.Interconnect Degradation
Giusti, DomenicoSTMicroelectronics Agrate, Italy.Ultrasound Devices
Gonzalez, MarioImec, BelgiumChiplets & Warpage
Górecki, PawełUniversity of Naples Federico II, Italy;
Gdynia Maritime University, Poland
Interactive Poster Session
Görner Tenorio, ChristianInfineon Technologies AG, Germany;
Technical University of Munich, Germany
Advanced MEMS
Interactive Poster Session
Goubault, TheotimeCEA LETI, FranceUltrasound Devices  Presenter
Grande, Ralph MaruUniversity of the Philippines, Philippines;
University of the Philippines Diliman, Philippines
Interactive Poster Session
Interactive Poster Session
Grinschgl, MarkusGIPRO GmbH, AustriaDigital Twins & Model Exchange
Gromala, Przemyslaw JakubBosch Hungary Kft, HungaryMission Profiles & RUL
Gromala, Przemyslaw JakubRobert Bosch Kft., HungaryMold & interface Materials
Grosse-Kockert, Corinnaberliner Nanotest und Design GmbH, GermanyInteractive Poster Session
Grosso, GiovannaSilicon Austria Labs GmbH, AustriaMultiphysics Simulation for Packaging
Groth, AnneFraunhofer Institute for Reliability and Microintegration (IZM), GermanyPCB Reliability
Gruber, Dieter P.Montanuniversität Leoben, Austria;
Polymer Competence Centre Leoben (PCCL) GmbH, Austria
Interactive Poster Session
Machine Learning-based Methods
Gruen, TobiasBerliner Nanotest and Design GmbH, GermanyThermal Experimental Characterization
Gschwandl, MarioOttronic Regeltechnik Gesellschaft m.b.H., GermanySolder Fatigue: Models & Mechanisms
Guerriero, PierluigiUniversity of Napoli Federico II, ItalyThermal Design Modeling and Experimental Characterization
Guo, ChunbingGuangdong University of Technology, ChinaThermal Behavioral Modeling
Gupta, NikhilDelft Universtiy of Technology, The NetherlandsPCB Reliability
H. Poelma, ReneDelft University of Technology, Netherlands, TheMachine Learning-based Methods
Hahn, SusannTU Chemnitz, GermanyMEMS Sensors
Hanke, MartinCADFEM Germany GmbH, GermanyMission Profiles & RUL
Haouari, Rachidimec, BelgiumInteractive Poster Session
Hartner, WalterInfineon Technologies AG, GermanyMold & interface Materials
Hasna, GüntherAnsys Germany GmbH, GermanyMission Profiles & RUL
Hauck, TorstenTU Berlin, GermanySolder Fatigue: Models & Mechanisms  Presenter
Haugwitz, ChristophTechnische Universität Darmstadt, GermanyAdvanced MEMS
He, JilinUniversität des Saarlandes, GermanySolder Fatigue: Models & Mechanisms
Heilmann, JensTechnische Universität Chemnitz, GermanyInteractive Poster Session
Heltzel, StanESA-ESTEC, The NetherlandsPCB Reliability
Herremans, KurtImec, BelgiumChiplets & Warpage
Herth, EtinneC2N-UPSACLAY, FranceInteractive Poster Session
Heyl, Christoph M.Deutsches Elektronen-Synchrotron DESY, Germany;
Helmholtz Institute Jena, Germany;
GSI Helmholtzzentrum für Schwerionenforschung GmbH, Germany
Advanced MEMS
Hild, FrançoisUniversité Paris-Saclay, FranceMaterials Modelling
Hiller, KarlaTU Chemnitz, GermanyMEMS Sensors
Hofmann, ChristianFraunhofer Institute for Electronic Nano Systems – ENAS, GermanyInteractive Poster Session
Thermal Design Modeling and Experimental Characterization
Hofmann, MaximilianFraunhofer IISB, GermanyMission Profiles & RUL
Hohlfeld, DennisUniversity of Rostock, GermanyAdvanced Simulation Methods
MEMS Sensors
Hollinger, ThomasPolymer Competence Center Leoben GmbH, GermanySolder Fatigue: Models & Mechanisms
Hołoń, KrzysztofAptiv Services PolandThermal Behavioral Modeling
Hong, Jian-ChengFeng Chia University, TaiwanInteractive Poster Session
Solder Fatigue: Models & Mechanisms
Horn, Tobias DanielFraunhofer Institute for Electronic Nano Systems (ENAS);
Fraunhofer ENAS, Micro Materials Center;
Technical University of Chemnitz, Center for Micro and Nanotechnologies
Machine Learning-based Methods
Material Modeling for Packaging  Presenter
Hou, FengzeChinese Academy of Sciences, ChinaMaterials Modelling
Houri, Samerimec, BelgiumInteractive Poster Session
Hsuan, Nai-JenRealtek Semiconductor Corp.Interactive Poster Session
Hu, SiyangUniversity of Rostock, Germany;
Jade University of Applied Sciences, Germany
MEMS Sensors  Presenter
Hu, XiaoDelft University of Technology, The Netherlands;
Boschman Technologies B.V.,The Netherlands
Materials Modelling
Huber, AlexanderMontanuniversität Leoben, Austria;
Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Austria
Interconnect Degradation  Presenter
Huber, Fabianams OSRAM AG, AustriaInteractive Poster Session
Huber, ThomasIntel Corporation, GermanyChiplets & Warpage
Hutchinson, JosephUniversity of Maryland, United States of AmericaInteractive Poster Session
Ibrahim, AliSATIE, Gustave Eiffel University, FranceMaterial Modeling for Packaging
Imtiaz, ShehryarTechnoprobe, Cernusco Lombardone, ItalyMirelai Session  Presenter
Israel, Laviniaams-OSRAM International GmbH, GermanyAdvanced Packaging Reliability
Iwata, YoshiharuThe University of Osaka, JapanInteractive Poster Session
Jacobs, ThibaultNoesis Solutions NV, BelgiumInteractive Poster Session  Presenter
Javaregowda, Mohan PrashanthIntel Corporation, GermanyChiplets & Warpage  Presenter
Jeong, Jae-SeongKorea Electronics Technology Institute (KETI), Korea, Republic of (South Korea)Interactive Poster Session  Presenter
Jetten, Hans-GerdIntel Corporation, GermanyChiplets & Warpage
Ji, FengBeijing Institute of Remote Sensing Equipment, ChinaMaterials Modelling
Jin, RenxiChinese Academy of Sciences, ChinaMaterials Modelling
Jithendrriyan, PallaviArizona State University - Tempe, USAAdvanced Packaging Reliability
Jöhrmann, NathanaelChemnitz University of Technology, Germany;
TU Chemnitz, Germany
Interactive Poster Session
JORDA, XAVIERCNM CSIC SpainMultiphysics Simulation for Packaging
Junesch, JulianeInfineon Technologies AG, GermanyMold & interface Materials
Kabakchiev, AlexanderRobert Bosch GmbH, GermanyMission Profiles & RUL
Kamble, Vikram GAT&S Austria Technologie & Systemtechnik, Austria;
Montanuniversität Leoben, Austria;
Polymer Competence Center Leoben GmbH, Austria
Interactive Poster Session  Presenter
Kang, QiushiChinese Academy of Sciences, ChinaMaterials Modelling
Kasinikota, Venu PrakashPolymer Competence Center Leoben GmbH (PCCL), GermanyDigital Twins & Model Exchange
Solder Fatigue: Models & Mechanisms
Kazar Mendes, MuniqueCEA LETI, FranceUltrasound Devices
Keller, MaxJade University, GermanyDigital Twins & Model Exchange  Presenter
Khatir, ZoubirSATIE, Gustave Eiffel University, FranceMaterial Modeling for Packaging  Presenter
Kim, Dong-HyeonDong-Eui University, South KoreaThermal Experimental Characterization
Kim, JaehyunC2N-UPSACLAY, FranceInteractive Poster Session
Kim, JaeMyeongSTATS ChipPAC, KoreaMultiphysics Simulation for Packaging
Kim, Yu-HwanYHENS, Korea, Republic of (South Korea)Interactive Poster Session
Kishor, ShranNXP Semiconductors, USAInteractive Poster Session
Klaus, VogelFraunhofer Institute for Electronic Nano Systems – ENAS, GermanyInteractive Poster Session
Koch, MathiasFraunhofer IZM , GermanyThermal Experimental Characterization
Köck, AntonMaterials Center Leoben (MCL), AustriaInteractive Poster Session
Kohaus, PatrickJade University of Applied Sciences, GermanyAdvanced Simulation Methods  Presenter
Korta, JakubAptiv Services PolandThermal Behavioral Modeling  Presenter
Korvink, Jan G.Institute of Microstructure Technology (IMT), Karlsruhe Institute of Technology (KIT), GermanyAdvanced Simulation Methods
Kosednar-Legenstein, BarbaraMaterials Center Leoben Forschung GmbH, Austria;
Materials Center Leoben (MCL), Austria
Interactive Poster Session
Interactive Poster Session
Kraker, ElkeMaterials Center Leoben Forschung GmbH, Austria;
Materials Center Leoben (MCL), Austria
Interactive Poster Session
Interactive Poster Session
Kreher, LisaFraunhofer ENAS, Chemnitz, GermanyInterconnect Degradation
Kriebel, DavidUniversity of Chemnitz, GermanyInteractive Poster Session
Krivec, ThomasAT&S Austria Technologie & Systemtechnik, AustriaInteractive Poster Session
Machine Learning-based Methods
Krusch, AnnettTU Chemnitz, GermanyMEMS Sensors
Kuehn, MartinFraunhofer ENAS, GermanyMold & interface Materials
Kuenzel, PetraFhI ENAS, GermanyMEMS Sensors
Kuipers, HansITEC EquipmentInteractive Poster Session
Kuo, Walton MatthewUniversity of the Philippines, PhilippinesInteractive Poster Session
Kupnik, MarioTechnische Universität Darmstadt, GermanyAdvanced MEMS
Kuttler, SimonFraunhofer IZM, GermanyInteractive Poster Session  Presenter
Labie, RietImec, BelgiumChiplets & Warpage
Ladlad, Rhiyan MaeUniversity of the Philippines, PhilippinesInteractive Poster Session  Presenter
LAGADEC, AymericELVIA Electronics, France.Interconnect Degradation
Lall, PradeepAuburn University, United States of AmericaInterconnect Degradation  Presenter
Mold & interface Materials  Presenter
Lammens, NicolasSiemens Industry Software NVInteractive Poster Session
Mirelai Session
Lang, Margit ChristaPolymer Competence Center Leoben GmbH, GermanySolder Fatigue: Models & Mechanisms
Digital Twins & Model Exchange  Presenter
LATORRE, LLORENÇPower electronics Llíria, SpainMultiphysics Simulation for Packaging
Le Rhun, GwenaelCEA LETI, FranceUltrasound Devices
Lee, YongTaekSTATS ChipPAC, KoreaMultiphysics Simulation for Packaging
Leib, JürgenFraunhofer IISB, GermanyMission Profiles & RUL
LEICHT, MickaëlUniversité de Lorraine, France.;
IRT Saint Exupéry, France.
Interconnect Degradation  Presenter
Leitgeb, VerenaMaterials Center Leoben Forschung GmbH, Austria;
Materials Center Leoben (MCL), Austria
Interactive Poster Session  Presenter
Interactive Poster Session
Li, FanAmpleon B.V.Thermal Experimental Characterization
Li, JinglinTU Delft, The NetherlandsMaterials Modelling  Presenter
Li, KunzhaoGuangdong University of Technology, ChinaThermal Behavioral Modeling
Li, Muyuanams-OSRAM International GmbH, GermanyAdvanced Packaging Reliability  Presenter
Li, Pin-SianFeng Chia University, TaiwanSolder Fatigue: Models & Mechanisms
Li, ShizhenSouthern University of Science and Technology. ChinaChiplets & Warpage  Presenter
Liang, JialongDelft University of Technology, The NetherlandsInteractive Poster Session  Presenter
Liao, Kuo-ChiNational Taiwan University, TaiwanInteractive Poster Session  Presenter
Lin, Chung-ChihNational Formosa University, TaiwanAdvanced Packaging Reliability
Lin, Han-wenIntel Corporation,TaiwanChiplets & Warpage
Lin, Si-HanFeng Chia University, TaiwanInteractive Poster Session
Liu, XinyuLamar University, United States of AmericaIEEE EPS Distinguished Lectures
Liu, XuDelft University of Technology, The NetherlandsChiplets & Warpage
Locker, DavidAuburn University, United States of AmericaInterconnect Degradation
Lurie, NilsTU Delft, The NetherlandsThermal Behavioral Modeling
Lutz, PeterInfineon Technologies AG, GermanyMold & interface Materials
Lykourinas, AntoniosUniversity of Patras, GreeceUltrasound Devices
Lyu, ChengzheTechnische Universität Dresden, GermanyInteractive Poster Session  Presenter
M. Reuther, GeorgInfineon Technologies AG Munich, GermanyMaterial Modeling for Packaging
Ma, RuiChinese Academy of Sciences, ChinaMaterials Modelling
Magnien, JulienMaterials Center Leoben Forschung GmbH, AustriaInteractive Poster Session
Mai, HolgerInfineon Technologies AG, GermanyMold & interface Materials
Majed, BenBTU Cottbus, GermanyThermal Experimental Characterization
Malang, HannaDeutsches Elektronen-Synchrotron DESY, GermanyAdvanced MEMS
Malgioglio, Giuseppe LuigiSTMicroelectronics, ItalyInteractive Poster Session
Thermal Experimental Characterization
Mariani, StefanoPolitecnico di Milano, ItalyInteractive Poster Session
Interactive Poster Session
Mirelai Session
MARIE, AlexandreIcam School of Engineering, France.Interconnect Degradation
Martin, ChristianUniversite Claude Bernard Lyon 1 Ampére, FranceInteractive Poster Session
Mastrangeli, MassimoDelft University of Technology, The NetherlandsAdvanced Simulation Methods
Mauri, MarcoTechnoprobe, Italy;
Technoprobe, Cernusco Lombardone, Italy
Interactive Poster Session
Interactive Poster Session
Mirelai Session
May, DanielTU Chemnitz, Germany;
Chemnitz University of Technology, Germany
Interactive Poster Session
Interactive Poster Session
Machine Learning-based Methods
Mazumder, Golam RakibAuburn University, USASolder Fatigue: Models & Mechanisms
Mazzieri, IlarioMOX, Dipartimento di Matematica, Politecnico di Milano, Italy.Ultrasound Devices
McCracken, StewartMaterials Consultancy Services Limited, Midlothian Innovation Centre, ScotlandMirelai Session
Mehner, JanUniversity of Chemnitz, GermanyInteractive Poster Session
Mehrabi, AlirezaDelft University of Technology, Netherlands, TheMachine Learning-based Methods  Presenter
Mehta, VishalAuburn University, United States of AmericaInterconnect Degradation
Meier, KarstenTechnische Universität Dresden, GermanyInteractive Poster Session
Melzer, MarcelFraunhofer Institute for Electronic Nano Systems – ENAS, GermanyInteractive Poster Session
Merafina, Francesco PioUniversity of Bari, ItalyInteractive Poster Session  Presenter
MERCIER, SébastienUniversité de Lorraine, France.Interconnect Degradation
Mermin, DanielCEA LETI, FranceUltrasound Devices
Meszmer, PeterChemnitz University of Technology, Germany;
TU Chemnitz, Germany;
Centre for Materials, Architectures and Integration of Nanomembranes (MAIN), Germany
Interactive Poster Session
Machine Learning-based Methods
Mitterhuber, LisaMaterials Center Leoben (MCL), AustriaInteractive Poster Session
Mitterhuber-Gress, LisaMaterials Center Leoben Forschung GmbH (MCL), AustriaMirelai Session
Moens, DavidKU Leuven;
Flanders Make
Mirelai Session
Mohammadi, ArashUniversity of Chemnitz, GermanyInteractive Poster Session  Presenter
Montserrat, JosepInstitute of Microelectronics of Barcelona (IMB-CNM-CSIC), SpainInteractive Poster Session
Moretti, EdoardoDepartment of Civil and Environmental Engineering, Politecnico di Milano, Italy.Ultrasound Devices
Morozov, AleksandrTU Berlin, GermanySolder Fatigue: Models & Mechanisms
Muehleisen, WolfgangSilicon Austria Labs GmbH (SAL), AustriaDigital Twins & Model Exchange
Müller, AlexanderBundeswehr Research Institute for Protective Technologies and CBRN Protection (WIS), GermanyInteractive Poster Session
Muller, AlexandruNational Institute for Research and Development in Microtechnologies (IMT), RomaniaInteractive Poster Session
Müller, Wolfgang H.TU Berlin, GermanySolder Fatigue: Models & Mechanisms
Musadiq, MuhammadDelft University of Technology (TU Delft), Netherlands, TheMirelai Session  Presenter
Najeem, Muhammad UmairUniversity of Greenwich, United Kingdom;
Materials Consultancy Services Limited, Midlothian Innovation Centre, Scotland
Mirelai Session  Presenter
Nandi, SounakFraunhofer Institute for Electronic Nano Systems – ENAS, GermanyInteractive Poster Session
Thermal Design Modeling and Experimental Characterization  Presenter
Nawghane, Chinmayimec, BelgiumMirelai Session
PCB Reliability  Presenter
Ng, Wee JianUniversity of Limerick, IrelandThermal Design Modeling and Experimental Characterization  Presenter
Nguyen, Binhimec, BelgiumMachine Learning-based Methods
Niemeier, RolandAnsys Germany GmbH, GermanyMission Profiles & RUL  Presenter
Niessner, MartinInfineon Technologies AG, GermanyInteractive Poster Session
Mold & interface Materials  Presenter
Ouhab, MerouaneMitsubishi Electric R&D Centre Europe, FranceMaterials Modelling
Ovsiannikov, NikitaTechnical University of Munich, GermanyMEMS Sensors  Presenter
Paek, JsIntel Corporation,TaiwanChiplets & Warpage
Panchenko, JulianaTechnische Universität Dresden, GermanyInteractive Poster Session
Panchwagh, Akshay VivekRobert Bosch GmbH, GermanyMold & interface Materials  Presenter
Pandit, Milindimec, BelgiumUltrasound Devices
Pandurangan, AathiAuburn University, United States of AmericaMold & interface Materials
Pangilinan, RafaelUniversity of the Philippines, Philippines;
University of the Philippines Diliman, Philippines
Interactive Poster Session
Interactive Poster Session  Presenter
Park, Sung-MinDong-Eui University, South KoreaThermal Experimental Characterization
Parolini, NicolaMOX, Dipartimento di Matematica, Politecnico di Milano, Italy.Ultrasound Devices
Passagrilli, CarloSTMicroelectronics, ItalyInteractive Poster Session
Payá-Vayá, GuillermoTU Braunschweig, GermanyInteractive Poster Session
Pendse, ChinmayKU Leuven, Belgium;
imec, Belgium
Ultrasound Devices  Presenter
Pérez-Tomás, AmadorInstitute of Microelectronics of Barcelona (IMB-CNM-CSIC), SpainInteractive Poster Session
PERROTIN, OlivierAlter Technology France,France.Interconnect Degradation
Petersmann, ManuelKompetenzzentrum Automobil- und Industrieelektronik GmbH, AustriaInterconnect Degradation
Pielmeier, FlorianInfineon Technologies AG, GermanyInteractive Poster Session
Poelma, RenéNexperia B.V., The NetherlandsPCB Reliability  Presenter
Poelma, René H.Delft University of Technology, The Netherlands;
Nexperia BV, The Netherlands
Mission Profiles & RUL
Poornabodha, NikhithaArizona State University - Tempe, USAAdvanced Packaging Reliability
Porathur, Fredy Johnams OSRAM AG, Austria;
Montanuniversität Leoben, Austria
Interactive Poster Session  Presenter
Pradhan, AbinashSilicon Austria Labs GmbH, AustriaMultiphysics Simulation for Packaging
Preu, HaraldInfineon Technologies AG, GermanyMold & interface Materials
Prinz, MatthiasFraunhofer ENAS, Chemnitz, GermanyInterconnect Degradation
Probst, Deanonsemi, Power Solution Group, Hopewell Junction, NYMultiphysics Simulation for Packaging
Punch, JeffUniversity of Limerick, IrelandThermal Design Modeling and Experimental Characterization
Qadir, AwaisChemnitz University of Technology, Germany;
TU Chemnitz, Germany
Interactive Poster Session  Presenter
Qureshi, Zain ul AbdinUniversity of Napoli Federico II, ItalyThermal Design Modeling and Experimental Characterization  Presenter
R. Niessner, MartinInfineon Technologies AG Munich, GermanyMaterial Modeling for Packaging
Rau, IngolfInfineon Technologies AG Munich, GermanyMaterial Modeling for Packaging
Rebollo, JoséInstitute of Microelectronics of Barcelona (IMB-CNM-CSIC), Spain;
CNM CSIC Spain
Interactive Poster Session
Multiphysics Simulation for Packaging
Refai-Ahmed, GamalAMD, USAIEEE EPS Distinguished Lectures  Presenter
Renna, MarcoSTMicroelectronics, ItalyInteractive Poster Session
Thermal Experimental Characterization
Reuter, DannyTU Chemnitz, GermanyMEMS Sensors
Richter-Trummer, SusanaFraunhofer ENAS, Chemnitz, GermanyInterconnect Degradation
Rincon-Ruiz, CarlosChemnitz University of Technology, Germany;
TU Chemnitz, Germany
Interactive Poster Session
Mold & interface Materials  Presenter
Robinson, AidanMaterials Consultancy Services Limited, Midlothian Innovation Centre, ScotlandMirelai Session
Rochus, Veroniqueimec, BelgiumInteractive Poster Session  Presenter
Machine Learning-based Methods  Presenter
Ultrasound Devices
RODRIGO, EUSEBIOCNM CSIC SpainMultiphysics Simulation for Packaging  Presenter
Roig Guitart, Jaumeonsemi, Central Engineering, Oudenaarde, Belgium; Roznov pod Radhostem, Czech Republic; Sunnyvale, CA, USAMultiphysics Simulation for Packaging
Rolland, DelphineCEA LETI, FranceUltrasound Devices
Röllig, MikeFraunhofer IKTS, GermanyInteractive Poster Session
Rongen, ReneNXP SemiconductorsMirelai Session
Roscher, FrankFraunhofer ENAS, GermanyMold & interface Materials
Roshanghias, AliSilicon Austria Labs GmbH, AustriaMultiphysics Simulation for Packaging
Rottenberg, XavierImec, Leuven, BelgiumUltrasound Devices
Ultrasound Devices
Roucou, RomualdNXP SemiconductorsMirelai Session
Rovitto, MarcoSTMicroelectronics, ItalyInteractive Poster Session
Rusu, CristinaRISE Research Institutes of Sweden, SwedenInteractive Poster Session
Rzepka, SvenFraunhofer ENAS, Chemnitz, Germany;
Fraunhofer ENAS, Micro Materials Center;
Technical University of Chemnitz, Center for Micro and Nanotechnologies;
Fraunhofer Institute for Electronic Nano Systems ENAS
Interconnect Degradation
Material Modeling for Packaging
Mission Profiles & RUL
Mold & interface Materials
Sagerer, MaikeAT&S Austrian Technologie & Systemtechnik AktiengesellschaftInteractive Poster Session
Saggese, GerardoUniversity of Napoli Federico II, ItalyThermal Design Modeling and Experimental Characterization
Salter, MichaelRISE Research Institutes of Sweden, SwedenInteractive Poster Session
Sanchis Alepuz, HeliosSilicon Austria Labs, AustriaThermal Behavioral Modeling  Presenter
Savoia, Alessandro StuartUniversità degli Studi Roma Tre, Italy.Ultrasound Devices
Schacht, RalphBTU Cottbus, GermanyThermal Experimental Characterization  Presenter
Schaumann, StephanTechnische Universität Darmstadt, GermanyAdvanced MEMS
Scheiter, LutzCWM GmbH, Chemnitz, GermanyInterconnect Degradation
Schiller, FerdinandInfineon Technologies AG, Germany;
Technical University of Munich, Germany
Advanced MEMS  Presenter
Interactive Poster Session  Presenter
Schneider-Ramelow, MartinTechnische Universität Berlin, GermanyInteractive Poster Session
Schneider-Ramelow, MartinTU Berlin, Germany;
Technische Universität Berlin, Germany
PCB Reliability
PCB Reliability
Schrag, GabrieleTechnical University of Munich, GermanyAdvanced MEMS
Interactive Poster Session
MEMS Sensors
Schrödel, YannickDeutsches Elektronen-Synchrotron DESY, Germany;
Helmholtz Institute Jena, Germany;
GSI Helmholtzzentrum für Schwerionenforschung GmbH, Germany
Advanced MEMS
Schuh, Jannisbudatec GmbH,12487 Berlin, GermanyInteractive Poster Session
Schulz, MarcusBerliner Nanotest und Design GmbH, Germany;
TU Chemnitz, Germany
Interactive Poster Session  Presenter
Schütz, ArwedJade University of Applied Sciences, GermanyAdvanced Simulation Methods
Schwerz, RobertFraunhofer IKTS, GermanyInteractive Poster Session  Presenter
Scognamillo, CiroUniversity of Naples Federico II, Italy;
University of Naples "Federico II", Italy
Interactive Poster Session
Multiphysics Simulation for Packaging
SEGOND, GillesIRT Saint Exupéry, France.Interconnect Degradation
Selbmann, FranzFraunhofer ENAS, GermanyMold & interface Materials
Seok, SeonhoC2N-UPSACLAY, FranceInteractive Poster Session  Presenter
Shaheen, MohammedHumain, Saudia ArabiaIEEE EPS Distinguished Lectures
Shaporin, AlexeyFhI ENAS, GermanyMEMS Sensors  Presenter
Shekhar, AdityaTU Delft, The NetherlandsMaterials Modelling
Thermal Behavioral Modeling
Shih, Meng-KaiNational Sun Yat-sen University, TaiwanAdvanced Packaging Reliability  Presenter
Simjanoski, FilipDelft University of Technology, Netherlands, The;
TU Delft, The Netherlands
Machine Learning-based Methods
Thermal Behavioral Modeling  Presenter
Soennecken, SörenTechnische Universität Darmstadt, GermanyAdvanced MEMS
Sokolov, AlekseiTechnische Universität Berlin, GermanyPCB Reliability  Presenter
Soriano, JarodUniversity of the Philippines, PhilippinesInteractive Poster Session
Soric, MarioInfineon Technologies AG, GermanyInteractive Poster Session
Sperti, MarcoSiemens Industry Software nv, BelgiumMirelai Session  Presenter
Srinivasan, PranavUniversity of Maryland, USA;
University of Maryland, United States of America
Advanced Packaging Reliability
Interactive Poster Session
Interactive Poster Session  Presenter
Interactive Poster Session
Sriramulu, HarshithaTechnische Universität Dresden, GermanyInteractive Poster Session
Stautner, SophiaInfineon Technologies AG, GermanyInteractive Poster Session
Steiner, AlexanderPolymer Competence Center Leoben GmbH (PCCL), GermanyDigital Twins & Model Exchange
Stelzer, AdrianNano-Join GmbH, Berlin, GermanyInteractive Poster Session
Stipsitz, MonikaSilicon Austria Labs, AustriaThermal Behavioral Modeling
Stöckel, ChrisFraunhofer Institute for Electronic Nano Systems ENAS, GermanyInteractive Poster Session
Stoyanov, StoyanUniversity of Greenwich, United KingdomMirelai Session
Stranieri, FrancescoTechnoprobe, Cernusco Lombardone, ItalyMirelai Session
Su, Chih-YenRealtek Semiconductor Corp.Interactive Poster Session  Presenter
Su, QinghuaNational Tsing Hua University, TaiwanInteractive Poster Session  Presenter
Interactive Poster Session
Interactive Poster Session
Su, Yu-TingNational Tsing Hua University, TaiwanInteractive Poster Session
Suhling, JeffAuburn University, United States of AmericaInterconnect Degradation
Suhling, Jeffrey C.Auburn University, USASolder Fatigue: Models & Mechanisms
Sun, BoGuangdong University of Technology, ChinaThermal Behavioral Modeling  Presenter
Sun, HaoyangBeijing Institute of Remote Sensing Equipment, ChinaMaterials Modelling
Sun, PingDelft University of Technology, The Netherlands;
Boschman Technologies B.V.,The Netherlands
Materials Modelling  Presenter
Tan, ChunjianSouthern University of Science and Technology, ChinaThermal Design Modeling and Experimental Characterization
Tang, ZhenhaoGuangdong University of Technology, ChinaThermal Behavioral Modeling
Tawade, Pratik V.Delft University of Technology, The NetherlandsAdvanced Simulation Methods
Thieu, Gia BaoTU Braunschweig, GermanyInteractive Poster Session
Tichem, MarcelDelft University of Technology (TU Delft), Netherlands, PMEInteractive Poster Session
Tinca, Iulia-ElizaInfineon Technologies AG, GermanyInteractive Poster Session  Presenter
Torri, Guilherme Brondaniimec, BelgiumMachine Learning-based Methods
Trinh, Cham ThiUniversität des Saarlandes, GermanySolder Fatigue: Models & Mechanisms
Trumann, Eike HendrikTU Braunschweig, GermanyInteractive Poster Session  Presenter
Tuerk, PatrickTU Chemnitz, GermanyMold & interface Materials
Van De Slyeke, MarnixACB, BelgiumPCB Reliability
van Dijk, MariusFraunhofer IZM, Germany;
Fraunhofer Institute for Reliability and Microintegration (IZM), Germany
Interactive Poster Session
PCB Reliability
van Driel, WillemDelft University of Technology, The NetherlandsInteractive Poster Session
Materials Modelling
Van Driel, Willem D.Delft University of Technology (TU Delft), Netherlands, The;
Delft University of Technology, The Netherlands;
Delft Universtiy of Technology, The Netherlands;
TU Delft, The Netherlands
Mirelai Session
Mission Profiles & RUL
PCB Reliability
Thermal Behavioral Modeling
Advanced Simulation Methods
Van Hoof, ChrisImec, Leuven, Belgium;
KU Leuven, Belgium
Ultrasound Devices
Ultrasound Devices
Van Paepegem, WimDepartment of Materials, Textiles and Chemical Engineering (MaTCh), Ghent University;
FlandersMake@UGent-MIRO
Interactive Poster Session
van Soestbergen, MichielNXP Semiconductors, Netherlands, TheDigital Twins & Model Exchange  Presenter
van Zeijl, HenkDelft University of Technology, The NetherlandsMission Profiles & RUL
van Zuijlen, AlbertAmpleon B.V.Thermal Experimental Characterization
Vandevelde, BartImec, BelgiumChiplets & Warpage
Mirelai Session
Mirelai Session
vanDriel, Willem. DTU Delft, The NetherlandsMaterials Modelling
Vanstreels, KrisImec, BelgiumChiplets & Warpage
Vasilache, DanNational Institute for Research and Development in Microtechnologies (IMT), RomaniaInteractive Poster Session
Vellvehí, AniolInstitute of Microelectronics of Barcelona (IMB-CNM-CSIC), SpainInteractive Poster Session
Vellvehí, MiquelInstitute of Microelectronics of Barcelona (IMB-CNM-CSIC), SpainInteractive Poster Session
VELLVEHI, MIQUELCNM CSIC SpainMultiphysics Simulation for Packaging
Verbeke, MathiasKU Leuven, Belgium;
Flanders Make@KU Leuven, Belgium
Mirelai Session
Vermaak, NatashaLehigh University, USAMaterials Modelling
Victory, Jamesonsemi, Central Engineering, Oudenaarde, Belgium; Roznov pod Radhostem, Czech Republic; Sunnyvale, CA, USAMultiphysics Simulation for Packaging
Vijayakumar, JaianthEuropean Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000, Grenoble, FranceInteractive Poster Session
Vinciguerra, VincenzoSTMicroelectronics, ItalyInteractive Poster Session  Presenter
Thermal Experimental Characterization  Presenter
Vogel, KlausFraunhofer Institute for Electronic Nano Systems, GermanyThermal Design Modeling and Experimental Characterization
Voigt, SvenFraunhofer Institute for Electronic Nano Systems ENAS, GermanyInteractive Poster Session
Volckaert, KlaraImec, BelgiumChiplets & Warpage  Presenter
von Wolff, DorianBundeswehr Research Institute for Protective Technologies and CBRN Protection (WIS), GermanyInteractive Poster Session
Vysotskyi, BogdanImec, Leuven, BelgiumUltrasound Devices
Wakamatsu, HidefumiThe University of Osaka, JapanInteractive Poster Session
Wang, HanshiSouthern University of Science and Technology, ChinaThermal Design Modeling and Experimental Characterization
Wang, QidongChinese Academy of Sciences, ChinaMaterials Modelling
Wang, WeiPeking University. China;
National Key Lab of Micro/Nano Fabrication Technology, China;
Beijing Advanced Innovation Center for Integrated Circuits, China
Materials Modelling
Wang, Wei-FongNational Tsing Hua University, TaiwanInteractive Poster Session  Presenter
Wang, YongAccoPower, ChinaThermal Design Modeling and Experimental Characterization
Weekers, Bartimec, BelgiumInteractive Poster Session
Weide-Zaage, KirstenLeibniz Universität Hannover, GermanyInteractive Poster Session
Weidlich, SebastianTU Chemnitz, GermanyMEMS Sensors
Wiemer, ElenaTechnische Universität Darmstadt, GermanyAdvanced MEMS
Wiese, SteffenUniversität des Saarlandes, GermanySolder Fatigue: Models & Mechanisms  Presenter
Wismath, SonjaTechnische Universität Darmstadt, GermanyAdvanced MEMS  Presenter
Wiss, ErikUniversität des Saarlandes, GermanySolder Fatigue: Models & Mechanisms
Wittler, OlafFraunhofer IZM, Germany;
Fraunhofer Institute for Reliability and Microintegration (IZM), Germany
Interactive Poster Session
PCB Reliability
PCB Reliability
Wittwer, PhilippNano-Join GmbH, Berlin, GermanyInteractive Poster Session
Wu, YananBerliner Nanotest and Design GmbH, Germany;
Chemnitz University of Technology, Germany
Interactive Poster Session  Presenter
Wu, YueqianSouthern University of Science and Technology, People's Republic of ChinaThermal Design Modeling and Experimental Characterization
Wunderle, BernhardTU Chemnitz, Germany;
Chemnitz University of Technology, Germany;
Fraunhofer Institute for Electronic Nano Systems – ENAS, Germany;
Centre for Microtechnologies (ZfM) Chemnitz, Germany;
Fraunhofer ENAS, Germany;
Technische Universität Chemnitz, Germany;
Fraunhofer ENAS, Chemnitz, Germany;
Centre for Materials, Architectures and Integration of Nanomembranes (MAIN), Germany
Interactive Poster Session
Interactive Poster Session
Interactive Poster Session
Interactive Poster Session
Interactive Poster Session  Presenter
Machine Learning-based Methods  Presenter
Material Modeling for Packaging
Mission Profiles & RUL
Mold & interface Materials
Thermal Experimental Characterization
Wyszyński, GrzegorzAptiv Services PolandThermal Behavioral Modeling
Yamauchi, YoshyukiThe University of Osaka, JapanInteractive Poster Session  Presenter
Yang, HaiboChinese Academy of Sciences, ChinaMaterials Modelling
Yang, YudongChinese Academy of Sciences, China;
Peking University. China
Materials Modelling  Presenter
Ye, HuaiyuSouthern University of Science and Technology. China;
Delft University of Technology, The Netherlands
Chiplets & Warpage
Thermal Design Modeling and Experimental Characterization  Presenter
Younis, RamiDelft Universtiy of Technology, The NetherlandsPCB Reliability
Yu, QiulinAustria Technologie & Systemtechnik AG;
Montanuniversitaet Leoben;
Polymer Competence Center Leoben GmbH
Machine Learning-based Methods  Presenter
Yuan, CadmusFeng Chia University, Taichung, TaiwanIEEE EPS Distinguished Lectures
Interactive Poster Session  Presenter
Solder Fatigue: Models & Mechanisms  Presenter
Zaal, JeroenNXP Semiconductors, USAInteractive Poster Session
Zalaffi, SamueleSTMicroelectronics, ItalyInteractive Poster Session  Presenter
Zhang, ChiPeking University. China;
National Key Lab of Micro/Nano Fabrication Technology, China
Materials Modelling
Zhang, Guo QiDelft University of Technology (TU Delft), Netherlands, ECTM;
Delft Universtiy of Technology, The Netherlands;
Delft University of Technology, The Netherlands;
TU Delft, The Netherlands
Interactive Poster Session
PCB Reliability
Chiplets & Warpage
Interactive Poster Session
Machine Learning-based Methods
Materials Modelling
Materials Modelling
Mirelai Session
Mission Profiles & RUL
Thermal Design Modeling and Experimental Characterization
Zhang, HongchaoChinese Academy of Sciences, ChinaMaterials Modelling
Zhang, KouchiTU Delft, The NetherlandsThermal Behavioral Modeling
Zhang, Sung-UkDong-Eui University, South KoreaThermal Experimental Characterization  Presenter
Zhang, WeiSouthern University of Science and Technology, People's Republic of ChinaThermal Design Modeling and Experimental Characterization
Zhang, YaqianTU Delft, The NetherlandsMaterials Modelling
Zhang, YuChinese Academy of Sciences, ChinaMaterials Modelling
Zhang, ZeChinese Academy of Sciences, ChinaMaterials Modelling
Zhang, ZihanDelft University of Technology, Netherlands, TheMachine Learning-based Methods
Zhao, DaweiFraunhofer IISB, GermanyMission Profiles & RUL
Zhao, FachengSTATS ChipPAC, SingaporeMultiphysics Simulation for Packaging  Presenter
Zhu, LipingSTATS ChipPAC, USAMultiphysics Simulation for Packaging
Ziegelwanger, HaraldElastic-Simulations GmbH, GermanySolder Fatigue: Models & Mechanisms  Presenter
Zimmermann, SvenFraunhofer Institute for Electronic Nano Systems – ENAS, GermanyInteractive Poster Session
Zschenderlein, UweChemnitz University of Technology, Germany;
TU Chemnitz, Germany
Interactive Poster Session
Machine Learning-based Methods
Material Modeling for Packaging
Mold & interface Materials
Zuendel, JuliaAT&S Austria Technologie & Systemtechnik, AustriaInteractive Poster Session
Zündel, JuliaAT&S Austrian Technologie & Systemtechnik AktiengesellschaftInteractive Poster Session