Investigating the Switching Loss-Reliability Trade-Off in TFP-MOSFET Voltage Regulators through Calibrated SPICE Simulations

Giorgio Eliseo^1,2, Ciro Scognamillo¹, Antonio Pio Catalano¹, Vincenzo d'Alessandro¹, Francesco De Paola², Jaume Roig Guitart³, Petr Betak³, James Victory³, Dean Probst⁴

¹University of Naples "Federico II", Italy; ²onsemi, Analog and Mixed-Signal Group, Milan, Italy; ³onsemi, Central Engineering, Oudenaarde, Belgium; Roznov pod Radhostem, Czech Republic; Sunnyvale, CA, USA; ⁴onsemi, Power Solution Group, Hopewell Junction, NY

Thermal and electrical simulations of Rad-hard Si VDMOS Transistors

EUSEBIO RODRIGO¹, MIQUEL VELLVEHI¹, XAVIER JORDA¹, LLORENÇ LATORRE², JOSÉ CAMPS², JOSÉ REBOLLO¹

¹CNM CSIC Spain; ²Power electronics Llíria, Spain

A Fast Multidomain System-level Simulation Model for GaN Transistor Package Optimization

Damiano Caponi, Giovanna Grosso, Abinash Pradhan, Ali Roshanghias

Silicon Austria Labs GmbH, Austria

Electromigration Simulation of C4 Solder Bumps with Cu and Ni Under-bump Metallization

Facheng Zhao¹, Liping Zhu², YongTaek Lee³, JaeMyeong Kim³

¹STATS ChipPAC, Singapore; ²STATS ChipPAC, USA; ³STATS ChipPAC, Korea