Conference Agenda
Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
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Agenda Overview |
| Session | ||
S14: Advanced Packaging Reliability
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| Presentations | ||
5:00pm - 5:30pm
Predicting Redistribution Layer (RDL) Interfacial Strength and Delamination in Fan-out Wafer Level Packaging 1Arizona State University - Tempe, USA; 2University of Maryland, USA 5:30pm - 5:50pm
Application of Bayesian Optimization to Wire Reliability Prediction in LED Packaging ams-OSRAM International GmbH, Germany 5:50pm - 6:10pm
Reliability Assessment of Advanced Fan-Out Packages Under Drop Impact Conditions 1National Sun Yat-sen University, Taiwan; 2National Formosa University, Taiwan | ||