Conference Agenda
Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
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Daily Overview |
| 8:45am - 9:00am |
Opening Location: Cedar-Magnolia-Sycamore Chair: Willem van Driel, TU Delft »Welcome Address« Anna Szerling |
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| 9:00am - 10:00am |
Industrial Keynotes Location: Cedar-Magnolia-Sycamore Chair: Michiel van Soestbergen, NXP Semiconductors Chair: Przemyslaw Gromala, Robert Bosch GmbH »From Reliability Testing to Reliability Thinking« »Glass Packaging and Its Reliability« |
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| 10:00am - 10:15am |
Honorary Award Ceremony Location: Cedar-Magnolia-Sycamore Chair: Sven Rzepka, Fraunhofer ENAS |
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| 10:15am - 10:40am |
Coffee Break |
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| 10:40am - 12:10pm |
S1: Technical Keynotes Location: Cedar-Magnolia-Sycamore Chair: Bart Vandevelde, imec Chair: Véronique Rochus, imec »Reaching Extremes with Additive Manufacturing of Electronics – From Wearable Medical to High-power and High-temperature Devices« |
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| 12:10pm - 1:10pm |
Lunch |
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| 1:10pm - 2:30pm |
S2: Interconnect Degradation Location: Cedar-Magnolia-Sycamore Chair: Jeffrey C. Suhling, Auburn University Chair: Iulia-Eliza Tinca, Infineon Technologies AG Material Property Prediction of Bi-doped SnAgCu Solders under High Strain Rates of Mechanical Shock and Vibration Auburn University, United States of America 1:30pm - 1:50pm Thermomechanical and Microstructural Mechanisms Governing Copper Degradation under High Strain Rate Thermo-mechanical Fatigue 1: Montanuniversität Leoben, Austria; 2: Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Austria 1:50pm - 2:10pm Thermal Shock Simulations of a PCB with Embedded Components and Microvia Based Interconnection: Meso-scale Modeling of the Woven Composite 1: Université de Lorraine, France.; 2: IRT Saint Exupéry, France.; 3: Icam School of Engineering, France.; 4: ELVIA Electronics, France.; 5: Alter Technology France,France. 2:10pm - 2:30pm Secondary Effects Causing Early Solder Fatigue Failure of QFN Components Subjected to Test- and Field Cycling 1: Fraunhofer ENAS, Chemnitz, Germany; 2: Siemens AG, Technology, Berlin, Germany; 3: CWM GmbH, Chemnitz, Germany |
S3: Ultrasound Devices Location: Alder+Poplar Chair: Gabriele Schrag, Technical University of Munich Chair: Marcus Schulz, Berliner Nanotest und Design GmbH High-performance and Scalable DG-SEM Modeling of Large PMUT Arrays for Biomedical Imaging 1: MOX, Dipartimento di Matematica, Politecnico di Milano, Italy.; 2: Department of Civil and Environmental Engineering, Politecnico di Milano, Italy.; 3: STMicroelectronics Agrate, Italy.; 4: Università degli Studi Roma Tre, Italy. 1:30pm - 1:50pm Finite Element Modeling and Experimental Validation of Dual-mode Ultrasonic Haptics on OLED Screens 1: CEA LETI, France; 2: CEA LIST, France 1:50pm - 2:10pm Analytical System-level Model for Optimization of pMUT Based Acoustic Power Delivery for Implants 1: Imec, Leuven, Belgium; 2: KU Leuven, Belgium 2:10pm - 2:30pm Simulating pMUT Array Characteristics for Sonomyographic Hand Gesture Recognition 1: KU Leuven, Belgium; 2: University of Patras, Greece; 3: imec, Belgium |
| 2:30pm - 2:40pm |
Transfer Break |
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| 2:40pm - 3:40pm |
S4: Chiplets & Warpage Location: Cedar-Magnolia-Sycamore Chair: Muyuan Li, ams-OSRAM International GmbH Chair: Vincenzo Vinciguerra, STMicroelectronics Holistic Warpage Evaluation Methodology Across Assembly Flow with Focus on Final Package Integrity in advanced packages like 2.3D-R & 2.3D-BT 1: Intel Corporation, Germany; 2: Intel Corporation,Taiwan 3:00pm - 3:20pm Thermal-mechanical Coupling Simulation of Chiplet 2.5D Packaging Based on Chiplet Distribution and Full Copper Interconnection 1: Southern University of Science and Technology. China; 2: Delft University of Technology, The Netherlands 3:20pm - 3:40pm Thermo-Mechanical Warpage Prediction and Validation of Large Chiplet Packages Imec, Belgium |
S5: Advanced Simulation Methods Location: Alder+Poplar Chair: Alexander Huber, Montanuniversität Leoben Chair: Rene Poelma, Nexperia B.V. Numerical Simulation of a Neuron-Electrode Interface in Python and Ansys 1: Jade University of Applied Sciences, Germany; 2: University of Rostock, Germany 3:00pm - 3:20pm 3D Parametric Simulations of Mass Transport and Mechanical Properties of a Microfluidic Barrier-on-Chip Device Delft University of Technology, The Netherlands 3:20pm - 3:40pm Multiphysics Topology Optimization for MEMS Institute of Microstructure Technology (IMT), Karlsruhe Institute of Technology (KIT), Germany |
| 3:40pm - 4:05pm |
Coffee Break |
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| 4:05pm - 5:25pm |
S6: MEMS Sensors Location: Cedar-Magnolia-Sycamore Chair: Christine Schwarz, Noesis Solutions NV Chair: Stoyan Stoyanov, University of Greenwich Layout-oriented Design of MEMS Acceleration Sensor and Evaluation of Packaging Effects 1: FhI ENAS, Germany; 2: TU Chemnitz, Germany 4:25pm - 4:45pm Design Optimization of a Multi-resonant Folded Beam Piezoelectric Energy Harvester Using an Efficient Two-phase Topology Optimization 1: University of Rostock, Germany; 2: Jade University of Applied Sciences, Germany 4:45pm - 5:05pm Physics-based State-space Model for Self-sensing in Piezoelectric MEMS Microphones 1: Technical University of Munich, Germany; 2: Infineon Technologies AG, Germany 5:05pm - 5:25pm Lab-on-Chip Acoustic Detection Platform: Design, Fabrication and Performance Evaluation 1: Univ. Polytechnique Hauts-de-France, France; 2: NANOMISENE Laboratory, Tunisia; 3: University of Sousse, Tunisia |
S7: Thermal Behavioral Modeling Location: Alder+Poplar Chair: Cadmus Yuan, Feng Chia University Chair: Julia Zündel, AT&S Austria Technologie & Systemtechnik Aktiengesellschaft An ANN-based Digital Twin for PCB Temperature Monitoring: Development and Validation Aptiv Services Poland 4:25pm - 4:45pm A Neural Network-Based Performance Assessment Approach for Heat-Dissipating Microchannels in Packages Guangdong University of Technology, China 4:45pm - 5:05pm Physics-inspired AI Models Trained on Abstract Synthetic Systems for Thermal Propagation Silicon Austria Labs, Austria 5:05pm - 5:25pm Electro-thermal Co-simulation of SiC MOSFET Double-pulse Tests Using a Peak-power-threshold (PPT) Method for Junction-temperature Estimation TU Delft, The Netherlands |
| 5:45pm - 6:45pm |
Bus ride to downtown |
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| 6:45pm - 7:15pm |
Time for a walk in the old town |
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| 7:15pm - 10:15pm |
Conference Dinner |
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