1:20pm - 1:40pmInductor Health Monitoring in PMIC under Adaptive Phase Shifting Operation for Minimization of Power and Thermal Loss
Dasol Park, Wujung Jun, Yong Jung, Byongsung Lee, Hyunglae Eun, Sunghoon Chun
Solution Development / Samsung semiconductor, Korea, Republic of (South Korea)
1:40pm - 2:00pmVertically Aligned Graphene Layers as Thermal Interface Material for Gallium Nitride Semiconductor Components
Saeed Akbari1, Mattias Eng1, Erik Adolfsson1, Konstantin Kostov1, Qin Wang1, Sepideh Amirpour2, Torbjörn Thiringer2, Jang-Kwon Lim1, Mietek Bakowski1, Dag Andersson1, Ashutosh Kumar1
1Rise Research Institutes of Sweden, Sweden; 2Chalmers University of Technology
2:00pm - 2:20pmTowards Health Monitoring of SiC MOSFETs by Precise Junction Temperature Profiling
Filip Simjanoski1, Aditya Shekhar1, Rene Poelma2, GuoQi Zhang1, Willem van Driel1,3
1TU Delft, Netherlands; 2Nexperia, Netherlands; 3Signify, Netherlands
2:20pm - 2:40pmRealization of Self-sintering by using Micro-heater Arrays with Inputting Current Pulse
Lai Wei1, Sander Dorrestein2, Henk van Zeijl1, Guoqi Zhang1
1Department of Microelectronics, Delft University of Technology, Delft, The Netherlands; 2Chip Integration Technology Center, Nijmegen, The Netherlands
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