4:15pm - 4:35pmPhysics-of-Failure based Lifetime Prediction for Power Electronics under Mission Profile Load Conditions
Jan Albrecht1,2, Tobias Horn1, Sven Rzepka1,2, Leonhard Hertenstein3
1Fraunhofer ENAS, Technologie-Campu 3, 09126 Chemnitz, Germany; 2Technische Universität Chemnitz, Reichenhainer Straße 70, 09126 Chemnitz, Germany; 3Mercedes-Benz AG, Hanns Klemm Str. 45, Boeblingen, Germany
4:35pm - 4:55pmSensitivity Analysis of Simulation-based Lifetime Extrapolation in the Low Temperature Swing Regime for Power Modules Stressed in Power Cycling Tests
Nils Zöllner, Sebastian Letz, David Übelacker, Oliver Schilling
Infineon Technologies AG, Germany
4:55pm - 5:15pmApplication of a Drucker-Prager Approach for Reliability Modelling of Inorganic Encapsulation Materials used for Power Electronic Applications
Falk Naumann, Marco Rudolph, Marcel Mittag, Michael Bernasch, Tino Stephan, Sandy Klengel
Fraunhofer Institute for Microstructure of Materials and Systems (IMWS), Germany
5:15pm - 5:35pmEnhancing Wire Simulation Accuracy through X-ray Imaging and Deformation Analysis
Muyuan Li1, Guan Liang Lee2, Wing Yew Wong2, Jason Koh2, Ee Lian Jack Lee2, Harald Laux1
1ams-OSRAM International GmbH, Germany; 2ams-OSRAM International GmbH, Malaysia
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