The 25th European Microelectronics &
Packaging Conference (EMPC 2025)
16 – 18 September 2025
World Trade Center, Grenoble | France
Conference Agenda
Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
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Session Overview |
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S 4D: POSTER SESSION #1
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Thermomechanical Study for Stress-management of Silicon Photonics Interposers Univ. Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France Reusing SMD Components on E-textiles: An Ageing Study by Combination of Corrosive Gases and Washing University of West Bohemia, Faculty of Electrical Engineering, Czech Republic A Comparative Study of Silver Sintering Pastes for Die-attach Applications: Microstructure, Mechanical Properties, and Reliability 1University of West Bohemia, Pilsen, Czech Republic; 2Elceram a.s., Hradec Kralove, Czech Republic Design and Evaluation of a Perforated Dielectric Flat Lens Antenna Array for D-band Applications Advanced Semiconductor Engineering, Inc., Taiwan A High Gain Antenna-in-Package (AiP) with Horn Structure for D-band Applications Advanced Semiconductor Engineering, Inc. (ASE), Taiwan Fine-pitch Flip-chip Bonding Process with Laser Non-conductive Paste (NCP) and Laser-assisted Bonding (LAB) for High-reliability ETRI, Korea, Republic of (South Korea) Indium as the Superconducting Interconnect for Quantum Chiplets 1Institute of Advanced Sciences, Yokohama National University, Japan; 2Graduate School of Engineering, Yokohama National University, Japan; 3Faculty of Engineering, Yokohama National University, Japan Test Equipment for Sensor Interfaces Emulated by Generic Electronic Control Unit National University of Sciences and Technologies Politehnica, Bucharest, Romania Grain Orientation Analysis for Thermal Cycling Evaluation of Die-attach Solder Joints 1The University of Osaka, Japan; 2RIKEN SPring-8 Center, Japan; 3Japan Synchrotron Radiation Research Institute, Japan Thermal Fatigue Resistance Improvement of New Al Bonding Wire 1Nippon Micrometal Corporation, Japan; 2Fraunhofer-Institute for Microstructure of Materials and Systems IMWS; 3Nippon Steel Corporation Thermal Analysis of Power Electronic Modules with Parametric Model Order Reduction 1School of Computing and Mathematical Sciences, University of Greenwich, London, United Kingdom; 2Department of Electrical and Electronic Engineering, University of Nottingham, Nottingham, United Kingdom Photoresist/polymer removal optimized chemistry with adding hydrogen radical in MEMS process fabrication and other applications with HDRF® Plasma-Therm Europe, France | ||