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Session Overview
Session
S 1C: Quality and Reliability
Time:
Tuesday, 16/Sept/2025:
11:15am - 12:30pm

Location: Mont Blanc


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Presentations

Defining a Scalable Test Methodology to Deliver High Quality AI Products

Soumya Padmanabha, Gautam Nayak, Zhenxuan Zhang

Meta Platforms Inc., United States of America



Embedding of components as an effective way to achieve high reliability for special applications products

Marek Koscielski, Wojciech Steplewski, Anna Sitek, Dorota Liszewska, Adam Lipiec, Janusz Borecki

Łukasiewicz Research Network - ITR, Poland



Assessment of QFN Assemblies’ Thermal Strain Characterization and its Evolution Through Thermal Cycling Aging

Vincent Sisomseun1,3, Olivier Maire1, Pascal Retailleau1, Catherine Jephos2, Alexandrine Guédon-Gracia3, Hélène Frémont3

1MBDA France, France; 2DGA MI, France; 3IMS Bordeaux, France



 
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