Promoting EMC Adhesion to Copper Leadframe Through Oxide Thickness Optimization
Céline Feautrier1, Benoit Saudet1, David Henry1, Christophe Licitra1, Nicolas Gauthier1, Paul-Henri Haumesser1, Ky-Lim Tan2, Hicham Aytous3, Jean-Michel Morel2
1Univ. Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France; 2Valeo, Créteil, France; 3Valeo, Sable sur Sarthe, France
Thermal and Structural Analysis of GaN Layers on Foreign Substrates for Vertical Power Devices
Verena Leitgeb1, Sandra Fischer1, Lisa Mitterhuber1, Barbara Kosednar-Legenstein1, Frank Brunner2, Eldad Bahat-Treidel2, Elke Kraker1
1Materials Center Leoben Forschung GmbH, Austria; 2Ferdinand-Braun-Institut, Germany
The next generation die top system (Ag-only DTS®) for Cu wire bonding on SiC chips
Thorsten Vehoff, Jürgen Scharf, Benjamin Fabian, Steffen Kötter, Vemal Raja Manikam
Heraeus Electronics GmbH & Co KG, Germany
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