Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

 
 
Session Overview
Date: Thursday, 18/Sept/2025
8:45am
-
9:30am
Keynote 6
Location: Amphitheatre

"Advanced Packaging – The Key Technology for Chiplet Integration"
by Prof. Dr.-Ing. Ulrike Ganesh (Managing Director, Fraunhofer IZM)

9:30am
-
9:40am
Room Change
9:40am
-
10:55am
S 7A: Smart Manufacturing
Location: Amphitheatre
 

Process Development for Cu Metallization on SiC MOSFETs with Inkjet Printing Technology

Xiaojie Tian, Golzar Alavi, Bernhard Polzinger, André Zimmermann



Development of a Novel Pure-ag-sintering Paste for a Jet-dispensing Process to Achieve Highest Possible Conductivity for Miniaturized Electronic Components with a Pressure-less Sintering Process

Battist Rábay, Adrian Stelzer, Julien Hossain



Additive Manufacturing of High-Performance Ceramics for Fabricating Single- and Multi-Material Components

Martin Schwentenwein, Josef Schlacher, Serkan Nohut, Sebastian Geier, Raul Bermejo

S 7B: IC Packaging
Location: Kilimandjaro
 

"Advanced Packaging" — A must for the Next-Gen AI and HPC Hardware ! And not Only !

M.Bilal Hachemi



Advancing IC Substrate Manufacturing: Overcoming Challenges and Exploring Opportunities with 10µm Line/Space Technology

Stephan Trautweiler



Heterogeneous Integration and Wafer-level Packaging by Micro-transfer-printing

Sebastian Wicht, Sandra Gozdzik, Kavana Mandya Sreenivasa Setty, Tino Jäger

S 7C: Intreconnection Technologies
Location: Mont Blanc
 

A Novel Photo-patternable Epoxy Flux Material for A New Horizon in Fine Pitch Flip-chip Interconnections

Gwang-Mun Choi, Jiho Joo, Jungho Shin, Jin-Hyuk Oh, Ki-Seok Jang, Chanmi Lee, Gyeongmin Park, Hyemi Lee, Hyeryeon Hwang, Ga-Eun Lee, Seong-Cheol Kim, Jaejun Lee, Kwang-Seong Choi, Yong-Sung Eom



Femtosecond Laser Drilling Technologies for Through Glass Via (TGV) Fabrication in Customised Glass Interposers

Dimitris Karnakis



Integration Technology Development of Chip-Antenna Interface for Short Range mmWave Wireless Communication

Ran Yin, Tilo Meister, Mojtaba Sohrabi, Krzysztof Nieweglowski, Franz Alwin Dürrwald, Christian Hoyer, Frank Ellinger, Dirk Plettemeier, Karlheinz Bock

S 7D: Inspection and Test
Location: Makalu
 

Key Technologies and Design Aspects for Advanced FOCoS Packaging

Cheng Hsin Liu, Yi-Sheng Lin, Yu-Jen Chang, Chen-Chao Wang, Chin-Pin Hung



Lensless Through-silicon Microscopy System for Precise Alignment in Photonic Integration Processes

Aleksandr Vlasov, Igor Shevkunov, Karen Egiazarian, Andrei Gurovich, Denis Rozhkov, Mikko Närhi, Jukka Viheriälä, Mircea Guina



Investigating the Role of Thermal Effects in RF Immunity of MEMS Microphones

Margarita Chizh, Matthias Schmidt, Sebastian Kisban, Bogdan Tanc, Yogesh Babu, Gregor Feiertag, Matthias Winter, Sushil Bharatan

10:55am
-
11:30am
Break – Exhibition
11:30am
-
12:45pm
S 8A: Quality and Reliability
Location: Amphitheatre
 

Defining a Scalable Test Methodology to Deliver High Quality AI Products

Soumya Padmanabha, Gautam Nayak, Zhenxuan Zhang



Microstructural Characterization for the Joining Interface of Ag@Si Composite Sinter Joining for SiC Power Device by Scanning Transmission Electron Microscopy

Masahiko Nishijima, Ran Liu, Yang Liu, Koji. S Nakayama, Cuantong Chen, Minoru Ueshima, Katsuaki Suganuma



SACN doped solder balls alloys aging impact on BGA's reliability performance

Edwin Wakem Tangui, Laurence Capellaro, Nohora Caicedo

S 8B: Assembly and Manufcaturing
Location: Kilimandjaro
 

High density 3D interconnections for high performance CdTe based X-rays detectors

Jean-Michel Guinet, Aline Meuris, Olivier Limousin, David Baudin, Jeremy Chauveau, Denis Chesnais, Eric Tan, Fabrice Soufflet, Olivier Garel



Atmospheric Plasma Cleaning of Copper Oxide and Tin Oxide for Flux-Free Interconnect Bonding

Daniel Pascual



A single step process for Die-attach and substrate-attach with pressure assisted sintering to face harsh conditions

Anne-Marie Laügt, Mael Boland, Melanie Mathon, Battist Rabay, Adrian Stelzer, Julien Hossain

S 8C: Power Electronics
Location: Mont Blanc
 

Measurements at High Temperature for Thermal Resistance of MOSFETs

Corina Ruxandra Mitulescu, Norocel Codreanu, Ciprian Ionescu, Paul Svasta, Mihai Branzei



Influence of Uneven Chip Solder Layer Thickness on the Reliability of Power Modules

Aylin Aksoy, Florian Wagner, Marcel Sippel



Reliability Evaluation of Direct Bonding for SiC Power Devices by Power Cycling Test

Marius Köhler, Jens Müller, Ansgar Ramesohl, Kurt-Georg Besendörfer, Nicolas Heuck

S 8D: Materials
Location: Makalu
 

Understanding Solder Creepage in Thin Si Devices Through Advanced Traceability Systems

Andrea Albertinetti, Reiner Maghirang, Chaimaa El Mazyani, Abderrahim Kourimy, Ismael Tahri



Enhancing the Reliability of Harsh Environment Electronics Through PFAS-free Multilayer ALD + Parylene Coatings

Rakesh Kumar



Insulation Materials for Advanced Packaging Applications

Reki Nakano

12:45pm
-
2:00pm
Lunch – Exhibition
2:00pm
-
2:45pm
Keynote 7
Location: Amphitheatre

"Charting a Path for the Chiplet Era and Beyond"
by Craig Bishop (Chief Technology Officer, Deca Technologies)

2:45pm
-
3:15pm
Awards and Closing
Location: Amphitheatre

 
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