Conference Agenda
Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
Please note that all times are shown in the time zone of the conference. The current conference time is: 29th June 2025, 06:03:04am CEST
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Session Overview |
Date: Monday, 01/Sept/2025 | |
8:00am | Registration Location: Patio |
9:00am - 10:30am | NATO Electromagnetic Environmental Effects (E3) Standardisation Location: Auditorium Successful NATO operations involve the military forces of many nations, and interoperability is essential for their success. This interoperability is underpinned by standardisation across all facets of the alliance, including technical standards covering electromagnetic environmental effects (E3). Electromagnetic compatibility plays a key role in ensuring that military equipment, systems, and platforms are not degraded by detrimental electromagnetic environmental effects which may be encountered during service – often long periods of time and exposure to severe environments. The NATO Allied Environmental Conditions and Tests Publications (AECTP) series define the operational environments in which NATO defence materiel must be designed to function, and provide detailed test requirements to ensure that equipment, systems and platforms can meet their performance requirements while operating in these environments. This tutorial aims to give the audience an overview of the current NATO E3 standards, how they have evolved over time to the point at which we now find them, and how they are used by nations to successfully build interoperability within the alliance.
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9:00am - 10:30am | Using 3D models for ESD protection devices for Signal Integrity and ESD Simulations Location: Room 105 Until now, system-level simulations that include electrostatic discharge (ESD) protection devices have relied on strong simplifications of the ESD device itself. For Signal Integrity (SI) simulations, high-speed engineers typically use simple capacitors or basic RLC circuits to introduce some level of realism. In ESD simulations, the industry has adopted the System Efficient ESD Design (SEED) methodology, which utilizes Transmission Line Pulsed (TLP) data to replicate the behavior of ESD devices under pulsed conditions. The simulation is then performed at the circuit level, incorporating simplifications and model reductions based on SPICE modeling. In this workshop, we demonstrate how electronic components, including ESD devices, can be modeled as 3D structures. We will present a step-by-step process for developing these models, selecting and validating the electrical parameters of materials. Additionally, we will explore their application in SI simulations, showcasing results in both the frequency and time domains. Building on this, we integrate these 3D models with the SEED methodology for ESD simulations. Finally, we discuss their impact at the system level, illustrating how these models enhance simulation accuracy—particularly in terms of S-parameters and ESD clamping behavior. |
9:00am - 10:30am | A New Standard for Shielding Measurement from DC to 40GHz: IEEE P2855 (Part 1) Location: Room 106 This workshop will give a general introduction to the future standard in construction P2855 about cable/connector assembly shielding effectiveness characterization from DC to 40GHz. This standard provides recommended measurement techniques for evaluating, and methods for specifying, the capabilities or effectiveness of shielding on cable/connector assemblies for the control of Electromagnetic Interference (EMI) to allow product compliance to common Government, regulatory, and customer requirements, and for achieving system Electromagnetic Compatibility (EMC). This standard also provides measurement techniques to evaluate, and methods to specify, cable/connector assemblies shielding capabilities for reducing the coupling of electromagnetic energy between cable/connector assemblies. Emphasis is placed on measurement techniques that have been adopted through incorporation into standards, both commercial and military, or that have been used extensively. A set of novelties will be presented on the methods that will be present in the standard. The workshop is divided into topics as: Magnetic shield method, DC method, Triaxial method, Injection line method, Parallel plate method, Localized injection method, Anechoic chamber method, G-TEM cell method, Reverberation chamber, Shielding Effectiveness Measurands. The workshop will help the audience to properly test and design cables, connectors and their assemblies for product EMC. Targeted Audience: • Primary: EMC engineers in electric and electronic product industries • Secondary: Cable, connector and their assembly designers; EMC researchers. |
9:00am - 10:30am | EMC of Grid-Tied Power Electronic Converters in Supraharmonics Frequency Range (Part 1) Location: Room 107 The global shift of energy paradigm to carbon-free technologies has significantly increased the penetration of grid-tied power electronics. Power electronic systems are a key enabler in the energy conversion process, from renewable generation like wind/solar power, electric vehicles down to lighting. To ensure smooth transition to green technologies, electronic systems must be compatible with each other and the power grid. Recently, there have been new disturbances on power grid due to high incompatibility of power electronic systems in the new frequency range of 2-150 kHz (i.e., supraharmonics) which has been unregulated in the past. Therefore, the introduction of new international standards will challenge the power electronics industry as no clear solution exists to comply with new standards. The emphasis of this tutorial is to give an overview on electromagnetic compatibility of power electronic converters in the supraharmonics frequency range. Firstly, the power grid data acquisition and time-frequency behavior will be introduced as well as suitability of standard AMN (Artificial Mains Network) or LISN (Line Stabilization Network). The noise propagation path modeling of power electronic converters will be focused for the second part of the tutorial, discussing the influence of DM and CM noise as well as closed loop impedance. Further, the black-box modeling strategy will be presented for power converter characterization. The third part of the tutorial is dedicated to EMI filter design as well as lifetime considerations which suitable topology and material selection will be discussed as well as influencing factors on the filter lifetime consideration. Finally, the tutorial is concluded by introducing a new developed software tool for EMI prediction and design for EMC in power electronic converters. |
9:00am - 10:30am | More, Better, Faster – The Rapid Evolution of Automotive EMC Design and Test (Part 1) Location: Room 108 The automotive industry is in the midst of an evolutionary cycle, the widespread significance of whch hasn’t been seen since the 50 years following the model introduced by Benz in 1886. The global adoption of electric propulsion and related systems, and increasing levels of advanced driver assistance systems, has promoted the development of new technologies and the birth of new companies. Industrial standards form the backbone of regulatory control, and also provide essential guidance that benefits industry practicioners. This tutorial will address the status, pros, and cons of some of the new and legacy EMC standards for vehicles and ESAs, while also highlighting the potential benefits of new and emerging EMC test techniques. One example of this related to communication signals, is seeing how the measured S-parameters of automotive high-speed cable assemblies (HSCA) can predict immunity to radiated electric fields, while time domain measurements verify signal integrity with eye diagrams. The design of Electric Vehicles (EVs) introduces significant EMC challenges due to the high-voltage transiets based architecture, which traditional low-voltage methods cannot adequately address. This tutorial will also discuss the unique transients generated by the HV bus and the additional emissions and immunity testing required by ISO 7637-4 and 21498 standards. Our speakers have extensive experience in automotive EMC/RF/Wireless design and testing and are active technical contributors to international standards committees including IEEE, ISO, SAE, and CISPR. |
9:00am - 10:30am | Intentional Electromagnetic Interference and Wireless Communication Systems: Impact, Detection and Localization of Attack Sources Location: Room 109 This tutorial will present the threats posed by intentional EM interference in the field of information systems security. After an introduction and a brief history of passed works on IEMIs, the main characteristics of the IEMIs that can be employed against communication systems will be presented. This will be followed by an introduction to cybersecurity exploitation of IEMI, providing an overview of how IEMI can be used by attackers and the outcomes on the security of information processed by electronic equipment. Several threat models will be explained and illustrated by a literature review or insights on original research. The rest of the tutorial will focus on the use case of Wi-Fi communications in the presence of radio jammers. First, the audience will be reminded of some preliminary information on the Wi-Fi protocol and OFDM modulation. Then, the mechanisms by which this IEMI affects the Wi-Fi communication protocol and OFDM modulation will be presented in detail. The different impacts will also be discussed and an experiment will be carried out live in the room to illustrate how the source of IEMI affects the communication quality, depending on the position of the IEMI source and the waveform of the IEMI signal. Finally, the rest of the tutorial will present work that has been carried out to detect and geolocate these sources of interference inside a building. |
10:30am - 11:00am | Coffee Break Location: Patio |
11:00am - 12:30pm | Fundamentals of Electromagnetic Compatibility (Part 1) Location: Auditorium This tutorial is an overview of many of the major topics that need to be considered when designing an electronic product or system to meet EMC requirements. The tutorial will present the foundational ideas from physics and mathematics and will demonstrate the engineering approaches to help the attendees to successfully design, evaluate, diagnose, and/or solve EMI problems. The main objective of this tutorial is to provide a learning opportunity for those that are new to EMC as well as provide a review of the basics to those who already have some experience in this area. |
11:00am - 12:30pm | A Review on the Characterization, Modeling and Simulation of Conducted and Radiated Emissions of Power Printed Circuit Boards (PPCB) Location: Room 105 For complete Electromagnetic Compatibility (EMC) studies at PCB and chip levels, we have conceived some demonstrators to precisely characterize and model the more realistic electromagnetic behaviors of circuits at PCB level. We want to keep understandings on effects and contributions on electrical and physical parameters of the different parts of a circuit on PCB. This description is focused on power chips of different semiconductor technologies, that are the main sources of electromagnetic noises in the range of the GHz. This is due to the very high switching times of these components that are nowadays under the thousands of nanoseconds and then can produce high frequency (HF) resonances. Emissions in conducted mode in power PCB are now over the MHz, even with a very low frequency voltage command (kHz). Then, radiated mode is inherently activated, because of the length of the wires and the dimensions of the Power PCB. The nominal design and dimensions, the choice of test points and HF connectors of our PPCB demonstrator are defined for both direct conducted measurements in differential and common mode, and for “equivalent Far-field” radiation measurements in TEM cells. We propose to review EMC/ EMI characterizations available for conducted and radiated evaluations of the emissions at component and circuit level. Then we present the different approaches for constructing an equivalent electrical or numerical model of the PPCB including its environment: packaging, cables, connectors and especially the insertion of probes and antenna, all contributors of the final EMC responses. Some examples of these "EMC Virtual Experiment", on demonstrators and case studies, would show the audience that they can master this methodology for their own EMC understandings and investigations. We illustrate this tutorial by some real uses and applications of this "Virtual Model " in some new and actual scientific and industrial topics: Multiphysics and external temperature impacts, conducted models for aerospace/MEA, couplings in traction chain of trains. |
11:00am - 12:30pm | A New Standard for Shielding Measurement from DC to 40GHz: IEEE P2855 (Part 2) Location: Room 106 This workshop will give a general introduction to the future standard in construction P2855 about cable/connector assembly shielding effectiveness characterization from DC to 40GHz. This standard provides recommended measurement techniques for evaluating, and methods for specifying, the capabilities or effectiveness of shielding on cable/connector assemblies for the control of Electromagnetic Interference (EMI) to allow product compliance to common Government, regulatory, and customer requirements, and for achieving system Electromagnetic Compatibility (EMC). This standard also provides measurement techniques to evaluate, and methods to specify, cable/connector assemblies shielding capabilities for reducing the coupling of electromagnetic energy between cable/connector assemblies. Emphasis is placed on measurement techniques that have been adopted through incorporation into standards, both commercial and military, or that have been used extensively. A set of novelties will be presented on the methods that will be present in the standard. The workshop is divided into topics as: Magnetic shield method, DC method, Triaxial method, Injection line method, Parallel plate method, Localized injection method, Anechoic chamber method, G-TEM cell method, Reverberation chamber, Shielding Effectiveness Measurands. The workshop will help the audience to properly test and design cables, connectors and their assemblies for product EMC. Targeted Audience: • Primary: EMC engineers in electric and electronic product industries • Secondary: Cable, connector and their assembly designers; EMC researchers. |
11:00am - 12:30pm | EMC of Grid-Tied Power Electronic Converters in Supraharmonics Frequency Range (Part 2) Location: Room 107 The global shift of energy paradigm to carbon-free technologies has significantly increased the penetration of grid-tied power electronics. Power electronic systems are a key enabler in the energy conversion process, from renewable generation like wind/solar power, electric vehicles down to lighting. To ensure smooth transition to green technologies, electronic systems must be compatible with each other and the power grid. Recently, there have been new disturbances on power grid due to high incompatibility of power electronic systems in the new frequency range of 2-150 kHz (i.e., supraharmonics) which has been unregulated in the past. Therefore, the introduction of new international standards will challenge the power electronics industry as no clear solution exists to comply with new standards. The emphasis of this tutorial is to give an overview on electromagnetic compatibility of power electronic converters in the supraharmonics frequency range. Firstly, the power grid data acquisition and time-frequency behavior will be introduced as well as suitability of standard AMN (Artificial Mains Network) or LISN (Line Stabilization Network). The noise propagation path modeling of power electronic converters will be focused for the second part of the tutorial, discussing the influence of DM and CM noise as well as closed loop impedance. Further, the black-box modeling strategy will be presented for power converter characterization. The third part of the tutorial is dedicated to EMI filter design as well as lifetime considerations which suitable topology and material selection will be discussed as well as influencing factors on the filter lifetime consideration. Finally, the tutorial is concluded by introducing a new developed software tool for EMI prediction and design for EMC in power electronic converters. |
11:00am - 12:30pm | More, Better, Faster – The Rapid Evolution of Automotive EMC Design and Test (Part 2) Location: Room 108 The automotive industry is in the midst of an evolutionary cycle, the widespread significance of whch hasn’t been seen since the 50 years following the model introduced by Benz in 1886. The global adoption of electric propulsion and related systems, and increasing levels of advanced driver assistance systems, has promoted the development of new technologies and the birth of new companies. Industrial standards form the backbone of regulatory control, and also provide essential guidance that benefits industry practicioners. This tutorial will address the status, pros, and cons of some of the new and legacy EMC standards for vehicles and ESAs, while also highlighting the potential benefits of new and emerging EMC test techniques. One example of this related to communication signals, is seeing how the measured S-parameters of automotive high-speed cable assemblies (HSCA) can predict immunity to radiated electric fields, while time domain measurements verify signal integrity with eye diagrams. The design of Electric Vehicles (EVs) introduces significant EMC challenges due to the high-voltage transiets based architecture, which traditional low-voltage methods cannot adequately address. This tutorial will also discuss the unique transients generated by the HV bus and the additional emissions and immunity testing required by ISO 7637-4 and 21498 standards. Our speakers have extensive experience in automotive EMC/RF/Wireless design and testing and are active technical contributors to international standards committees including IEEE, ISO, SAE, and CISPR. |
11:00am - 12:30pm | IEMI (Intentional Electromagnetic Interference) Risk Management for Critical Infrastructures (Part 1) Location: Room 109 Intentional electromagnetic inference (IEMI) becomes more and more a threat to modern society since the availability of IEMI sources increases, while modern electronic systems are becoming more vulnerable. Due to the widespread use of electronic systems, that are necessary to build up critical infrastructure, even partial breakdown can lead to a substantial interruption of public life. This workshop focuses on the vulnerability and protection of typically involved electronic systems and critical infrastructures. The workshop will present multiple approaches for the protection of electronics and critical infrastructures which considers not only the classic protective measures but also modern approaches in the area of risk management, resilience and functional safety. |
12:30pm - 2:20pm | Lunch Location: Restaurants nearby |
2:20pm - 3:50pm | Fundamentals of Electromagnetic Compatibility (Part 2) Location: Auditorium This tutorial is an overview of many of the major topics that need to be considered when designing an electronic product or system to meet EMC requirements. The tutorial will present the foundational ideas from physics and mathematics and will demonstrate the engineering approaches to help the attendees to successfully design, evaluate, diagnose, and/or solve EMI problems. The main objective of this tutorial is to provide a learning opportunity for those that are new to EMC as well as provide a review of the basics to those who already have some experience in this area. |
2:20pm - 3:50pm | EMC in Power Electronics: Principles of EMI Generation, Aggregation and Mitigation for Electrical Systems and Electrical Transport (Part 1) Location: Room 105 Power electronic systems are essential to modern energy conversion, enabling efficient regulation and distribution of electrical energy across various applications. As electrification and digitalization advance, power electronics play an increasingly crucial role but inherently generate electromagnetic interference (EMI), which can degrade performance and compromise reliability. Ensuring electromagnetic compatibility (EMC) is critical to maintaining functionality, safety, and regulatory compliance. This tutorial explores EMC challenges in power electronics, covering EMI sources, propagation mechanisms, and mitigation strategies. It introduces an open research and teaching platform for DC-DC converters, demonstrating FPGA-based implementation for hands-on EMC design. Additionally, the session examines conducted emission aggregation in smart grids, modeling techniques for interference propagation, and statistical approaches such as Pearson’s Random Walk for predicting EMI behavior in multi-converter systems. Advanced EMI filtering solutions for evolving power applications, including aerospace motor drive systems, will also be discussed, with a focus on optimizing weight, efficiency, and compliance with industry standards. |
2:20pm - 3:50pm | Ansys Industrial Forum (Part 1) Location: Room 106 |
2:20pm - 3:50pm | Physical Layer Security against Compromising Electromagnetic Emanations (Part 1) Location: Room 107 In recent years, security measures for information systems have advanced rapidly at the application and network layers. However, the security of the underlying physical layer is equally critical. A breach at this level can fundamentally undermine the entire system’s defenses. Of particular concern are electromagnetic (EM) attacks, which can inflict severe damage while leaving little or no trace. This tutorial session will focus on the degradation of security at the physical layer due to electromagnetic emissions. It will provide attendees with insights into these threats and effective mitigation strategies. We will primarily examine passive attacks that intercept unintentional electromagnetic emissions from electronic devices to extract confidential data—such as encryption keys—and address other emerging threats that have recently gained attention. Given the serious risks these attack vectors pose to critical infrastructure and sensitive information, the session will also discuss the urgency of defending against physical attacks in an increasingly AI-driven, information-centric society, on par with conventional cyber attacks. The session will offer a comprehensive overview of various electromagnetic attack methods, case studies, mitigation techniques, and their impact on diverse electronic devices. Furthermore, we will explore new challenges and vulnerabilities in electromagnetic security. By fostering an environment of knowledge exchange among researchers, engineers, and security experts, our goal is to stimulate discussions on future research directions and contribute to the development of a secure and reliable electromagnetic environment. |
2:20pm - 3:50pm | Effectively Addressing Measurement Uncertainty in Electromagnetic Compatibility Testing (Part 1) Location: Room 108 This workshop convenes leading experts in measurement uncertainty, emphasizing its vital importance in electromagnetic compatibility (EMC) testing. Participants will explore fundamental concepts of measurement uncertainty and gain practical methodologies for performing calculations in commercial test laboratories. The session will cover effective data collection techniques and streamlined calculation methods. One segment will focus on estimating uncertainty specifically for antenna measurements, in accordance with the Guide to Uncertainty in Measurements. Additionally, a discussion will address the challenges of measuring uncertainties within a multipurpose robotic antenna test system. The workshop will also provide insights into measurement uncertainties related to high-altitude electromagnetic pulse (HEMP) and high-power electromagnetic (HPEM) testing. This will include an overview of various test sites, instrumentation, and the evaluation of normative specifications against both civil and military standards. Lastly, participants will be introduced to Polynomial Chaos Theory as a technique for uncertainty propagation and sensitivity analysis in power electronic circuit design. The session will demonstrate how stochastic simulations can effectively integrate uncertainties from multiple sources. Overall, this workshop aims to equip attendees with the essential knowledge and tools to navigate the complexities of measurement uncertainty in EMC testing, enhancing their understanding of its implications in both commercial and research environments. |
2:20pm - 3:50pm | IEMI (Intentional Electromagnetic Interference) Risk Management for Critical Infrastructures (Part 2) Location: Room 109 Intentional electromagnetic inference (IEMI) becomes more and more a threat to modern society since the availability of IEMI sources increases, while modern electronic systems are becoming more vulnerable. Due to the widespread use of electronic systems, that are necessary to build up critical infrastructure, even partial breakdown can lead to a substantial interruption of public life. This workshop focuses on the vulnerability and protection of typically involved electronic systems and critical infrastructures. The workshop will present multiple approaches for the protection of electronics and critical infrastructures which considers not only the classic protective measures but also modern approaches in the area of risk management, resilience and functional safety. |
3:50pm - 4:20pm | Coffee Break Location: Patio |
4:20pm - 5:50pm | Fundamentals of Electromagnetic Compatibility (Part 3) Location: Auditorium This tutorial is an overview of many of the major topics that need to be considered when designing an electronic product or system to meet EMC requirements. The tutorial will present the foundational ideas from physics and mathematics and will demonstrate the engineering approaches to help the attendees to successfully design, evaluate, diagnose, and/or solve EMI problems. The main objective of this tutorial is to provide a learning opportunity for those that are new to EMC as well as provide a review of the basics to those who already have some experience in this area. |
4:20pm - 5:50pm | EMC in Power Electronics: Principles of EMI Generation, Aggregation and Mitigation for Electrical Systems and Electrical Transport (Part 2) Location: Room 105 Power electronic systems are essential to modern energy conversion, enabling efficient regulation and distribution of electrical energy across various applications. As electrification and digitalization advance, power electronics play an increasingly crucial role but inherently generate electromagnetic interference (EMI), which can degrade performance and compromise reliability. Ensuring electromagnetic compatibility (EMC) is critical to maintaining functionality, safety, and regulatory compliance. This tutorial explores EMC challenges in power electronics, covering EMI sources, propagation mechanisms, and mitigation strategies. It introduces an open research and teaching platform for DC-DC converters, demonstrating FPGA-based implementation for hands-on EMC design. Additionally, the session examines conducted emission aggregation in smart grids, modeling techniques for interference propagation, and statistical approaches such as Pearson’s Random Walk for predicting EMI behavior in multi-converter systems. Advanced EMI filtering solutions for evolving power applications, including aerospace motor drive systems, will also be discussed, with a focus on optimizing weight, efficiency, and compliance with industry standards. |
4:20pm - 5:50pm | Ansys Industrial Forum (Part 2) Location: Room 106 |
4:20pm - 5:50pm | Physical Layer Security against Compromising Electromagnetic Emanations (Part 2) Location: Room 107 In recent years, security measures for information systems have advanced rapidly at the application and network layers. However, the security of the underlying physical layer is equally critical. A breach at this level can fundamentally undermine the entire system’s defenses. Of particular concern are electromagnetic (EM) attacks, which can inflict severe damage while leaving little or no trace. This tutorial session will focus on the degradation of security at the physical layer due to electromagnetic emissions. It will provide attendees with insights into these threats and effective mitigation strategies. We will primarily examine passive attacks that intercept unintentional electromagnetic emissions from electronic devices to extract confidential data—such as encryption keys—and address other emerging threats that have recently gained attention. Given the serious risks these attack vectors pose to critical infrastructure and sensitive information, the session will also discuss the urgency of defending against physical attacks in an increasingly AI-driven, information-centric society, on par with conventional cyber attacks. The session will offer a comprehensive overview of various electromagnetic attack methods, case studies, mitigation techniques, and their impact on diverse electronic devices. Furthermore, we will explore new challenges and vulnerabilities in electromagnetic security. By fostering an environment of knowledge exchange among researchers, engineers, and security experts, our goal is to stimulate discussions on future research directions and contribute to the development of a secure and reliable electromagnetic environment. |
4:20pm - 5:50pm | Effectively Addressing Measurement Uncertainty in Electromagnetic Compatibility Testing (Part 2) Location: Room 108 This workshop convenes leading experts in measurement uncertainty, emphasizing its vital importance in electromagnetic compatibility (EMC) testing. Participants will explore fundamental concepts of measurement uncertainty and gain practical methodologies for performing calculations in commercial test laboratories. The session will cover effective data collection techniques and streamlined calculation methods. One segment will focus on estimating uncertainty specifically for antenna measurements, in accordance with the Guide to Uncertainty in Measurements. Additionally, a discussion will address the challenges of measuring uncertainties within a multipurpose robotic antenna test system. The workshop will also provide insights into measurement uncertainties related to high-altitude electromagnetic pulse (HEMP) and high-power electromagnetic (HPEM) testing. This will include an overview of various test sites, instrumentation, and the evaluation of normative specifications against both civil and military standards. Lastly, participants will be introduced to Polynomial Chaos Theory as a technique for uncertainty propagation and sensitivity analysis in power electronic circuit design. The session will demonstrate how stochastic simulations can effectively integrate uncertainties from multiple sources. Overall, this workshop aims to equip attendees with the essential knowledge and tools to navigate the complexities of measurement uncertainty in EMC testing, enhancing their understanding of its implications in both commercial and research environments. |
4:20pm - 5:50pm | IEMI (Intentional Electromagnetic Interference) Risk Management for Critical Infrastructures (Part 3) Location: Room 109 Intentional electromagnetic inference (IEMI) becomes more and more a threat to modern society since the availability of IEMI sources increases, while modern electronic systems are becoming more vulnerable. Due to the widespread use of electronic systems, that are necessary to build up critical infrastructure, even partial breakdown can lead to a substantial interruption of public life. This workshop focuses on the vulnerability and protection of typically involved electronic systems and critical infrastructures. The workshop will present multiple approaches for the protection of electronics and critical infrastructures which considers not only the classic protective measures but also modern approaches in the area of risk management, resilience and functional safety. |
6:00pm - 11:00pm | IEEE Women in Engineering Social Event |
Date: Friday, 05/Sept/2025 | |
8:30am - 9:00am | Registration Location: Patio |
9:00am - 10:30am | Automotive EMC (Part 1) Location: Auditorium Automotive electric / electronic systems are endlessly growing in complexity with a permanent constraint of a constant or reduced time-to-market. Therefore, there is a strong need to improve constantly the efficiency of the EMC related tasks throughout the entire development process, starting from the design phase until the full-vehicle validation phase. This workshop intends to present an overview of the most recent industrial and academic advances in the field of automotive EMC design, modeling and simulation as well as in the field of automotive standards, testing and measurements. The presentations in this workshop will cover EMC issues at system, sub-system, equipment, and component levels. In particular, topics addressed by the speakers will include hybrid power-train systems EMC analysis, antenna implementation, equipment design, advanced testing techniques, printed-circuit-board optimization, and electric/electronic component characterization. |
9:00am - 10:30am | Recent Developments in Near-Field Measurement and Its Applications in EMC (Part 1) Location: Room 105 With the growing demand for 6G communication, automotive technologies, and artificial intelligence, modern electronic systems require high power levels exceeding hundreds of kilowatts and ultra-high data transfer rates beyond hundreds of Gbps. These advancements pose significant challenges for electric and RF designs, particularly in addressing EMC (Electromagnetic Compatibility) issues. Near-field measurement has emerged as a cost-effective and practical solution for pre-testing and pre-certification, especially when full-wave modeling and simulation become impractical due to the complexity of real-world applications. This workshop will introduce and showcase recent advancements in near-field scanning, covering fundamental measurement principles,fast and adaptive scanning techniques, efficient data acquisition and near-field modeling methods, and their engineering applications in EMC. Attendees from both academia and industry will benefit from expert insights into smart scan, probe compensation, robotic automation, and machine learning, offering efficient, reliable, and scalable solutions for EMC challenges. |
9:00am - 10:30am | You Had Me at “Reverb…”! (Part 1) Location: Room 106 Reverb? Reverb. Are you looking for reverbs? Wait. Okay, okay. Okay. If this is where it has to happen, at the EMC Europe 2025 conference, this is where it has to happen, in this very workshop. We are not letting you go without learning about the well-known reverberation chambers, the statistical methods used to evaluate fields inside them, their theory and applications. How about that? This is our specialty. You know, we were good in the laboratories. But we came here, and we have prepared a workshop, but not alone. We have with us speakers from different areas of expertise regarding reverberation chambers, all from different institutes. And now, we just… are ready! Today, our little workshop, our presentations, and our live demonstrations using a Vibrating Intrinsic Reverberation Chamber (VIRC) have a big day. A very, very big day. But so far, it is not complete, it isn’t nearly close to being in the same vicinity as complete, because we have not shared it with you… yet. We cannot wait for you to witness the presented theory in action, and even participate in performing some of the experiments yourself. We live in an EMC world, a reverberating world, and we work with many people who specialize in this field… We have them with us. We are just waiting for you! Made possible with support of NEPIT. |
9:00am - 10:30am | EMC Standard Evolution: Aeronautic vs. Automotive (Part 1) Location: Room 107 This workshop introduce the issues at the level of standards and norms introduced by new technologies within Aeronautical and Automotive transport, in particular with the introduction of electric and hybrid propulsion systems. Indeed, standards must be able to ensure the safety of users by proposing EMC tests that allow the use of future transport in the best possible conditions. For example, with the arrival of the electrification of propulsion in aeronautics and the generalization of power chains, new challenges appear on the control of crosstalk, conducted emissions generated by increasingly high switching frequencies or radiated fields with regard to exposure to waves of the human body. However, on this last subject, the automotive sector has long worked on a normative framework to ensure the safety of people when using electric or hybrid cars. Another example is the arrival of autonomous cars that no longer require human intervention for driving. The automotive regulatory framework will also have to take into account more stringent constraints to ensure passenger safety during journeys, potentially leading it towards constraints close to the aeronautical field. Through these two examples, we can easily understand that the two fields can evolve together and in a coordinated manner to benefit from the work of each. At the end of this workshop, a slot will be dedicated to an exchange on the subject with the audience. The workshop is divided into topics as: Standard, Nom, EMI, Susceptibility, Emissivity, Crosstalk, Human exposure, Shielding Effectiveness Measurands. The workshop will help the audience to properly test and design systems and their equipment for product EMC. Targeted Audience: • Primary: EMC test engineers in electric and electronic product industries • Secondary: Power Electronics designers, Systems designers, Harness designers; EMC researchers. |
9:00am - 10:30am | Machine Learning in EMC: a Potential Compatibility Location: Room 108 We propose a tutorial around the usage and applicability of ML in EMC. The aim would be to highlight the best practices when using ML in the context of EMC and related topics. As ML models are data-driven, particular attention must be paid to data capture and processing. The data which is typically used in EMC applications (from measurement or simulation) is treated from the point of view of the ML. Therefore, we will insist on the expertise needed to build adequate experimental designs in order to obtain reliable data, and to carry out the appropriate data processing. After presenting strategies to collect the data correctly, we will talk about the methodology for assessing the data's potential to address our problem. Then, we will focus on how to select the most suitable ML models. In particular, we will present the pros and cons of the most common ML models. In addition, we will talk about the different steps of the process, including training, validation, and testing, and emphasizing the importance of using appropriate evaluation metrics. Finally, we will show several examples related to EMC challenges where everything we spoke about was put into practice, taking into account industrial constraints. These examples underline the need for expertise in both EMC and ML to make them compatible. |
9:00am - 10:30am | Advances and Challenges in Active EMI Filters for Next-Generation Power Electronics (Part 1) Location: Room 109 The rapid evolution of power electronics in various domains, including automotive, aerospace, and industrial applications, has brought electromagnetic compatibility (EMC) challenges to the forefront of design considerations. The conventional Electromagnetic Interference (EMI) mitigation techniques pose various constraints and to overcome these challenges, Active EMI Filters (AEFs) are gaining popularity. This workshop presents a unique opportunity to explore cutting-edge developments in Active EMI Filters (AEFs), a technology poised to revolutionize EMC solutions across multiple industries. Leading experts from renowned companies and research institutions will present their latest findings and innovations in both digital and analog AEF (DAEF and AAEF) technologies. At the forefront of the workshop, the presenters will provide insights into the general working principles of DAEF and AAEF. The workshop will cover various topics, ranging from fundamental principles to stability analysis to practical implementations in high-power applications. Moreover, some potential areas of improvement in these technologies for implementation in a variety of applications will be discussed as well. Attendees will gain insights into assessing system parameter’s impact on AEF performance in automotive eDrives, stability analysis techniques for optimizing insertion loss, and the latest trends in three-phase AC and DC motor drives. In the domain of Active Filtering, the real world applications and the placement of components in high power applications is overlooked. The presenters will showcase the implications of various system parameters on the performance evaluation of AEFs. Moreover, the challenges that hinder the implementation of DAEFs or AAEFs in various applications (aerospace, industrial and automotive) will be presented. The workshop also aims at showcasing advancements in standalone AEF ICs, offering reduced and cost optimized system solutions. Furthermore, it will explore the potentials of digital active filters for common mode EMI suppression in power electronic systems, providing a comparative analysis with traditional methods and outlining future development paths. A special focus will be given to the constraints and opportunities for high-power (50 kW) AEFs in aeronautical applications, addressing the critical need for weight reduction and cost-effective EMI solutions in aircraft electrification. By bringing together diverse perspectives from industry leaders and researchers, this workshop aims to encourage collaboration and drive innovation in AEF technology. Participants will have the opportunity to engage in discussions on overcoming current limitations, exploring new applications, and shaping the future of EMC solutions for nextgeneration power electronics. Active EMI Filtering is a growing field which addresses the ever-growing challenge of introducing sophisticated solutions. Presenting this topic at the conference will provide attendees with actionable insights and the presenters can also benefit from it, since variety of ideas will be discussed/shared during an open Q&A session. This workshop is an essential event for EMC specialists, power electronics engineers, and researchers looking to stay at the forefront of AEF technology and its transformative potential across various industries. |
10:30am - 11:00am | Coffee Break Location: Patio |
11:00am - 12:30pm | Automotive EMC (Part 2) Location: Auditorium Automotive electric / electronic systems are endlessly growing in complexity with a permanent constraint of a constant or reduced time-to-market. Therefore, there is a strong need to improve constantly the efficiency of the EMC related tasks throughout the entire development process, starting from the design phase until the full-vehicle validation phase. This workshop intends to present an overview of the most recent industrial and academic advances in the field of automotive EMC design, modeling and simulation as well as in the field of automotive standards, testing and measurements. The presentations in this workshop will cover EMC issues at system, sub-system, equipment, and component levels. In particular, topics addressed by the speakers will include hybrid power-train systems EMC analysis, antenna implementation, equipment design, advanced testing techniques, printed-circuit-board optimization, and electric/electronic component characterization. |
11:00am - 12:30pm | Recent Developments in Near-Field Measurement and Its Applications in EMC (Part 2) Location: Room 105 With the growing demand for 6G communication, automotive technologies, and artificial intelligence, modern electronic systems require high power levels exceeding hundreds of kilowatts and ultra-high data transfer rates beyond hundreds of Gbps. These advancements pose significant challenges for electric and RF designs, particularly in addressing EMC (Electromagnetic Compatibility) issues. Near-field measurement has emerged as a cost-effective and practical solution for pre-testing and pre-certification, especially when full-wave modeling and simulation become impractical due to the complexity of real-world applications. This workshop will introduce and showcase recent advancements in near-field scanning, covering fundamental measurement principles,fast and adaptive scanning techniques, efficient data acquisition and near-field modeling methods, and their engineering applications in EMC. Attendees from both academia and industry will benefit from expert insights into smart scan, probe compensation, robotic automation, and machine learning, offering efficient, reliable, and scalable solutions for EMC challenges. |
11:00am - 12:30pm | You Had Me at “Reverb…”! (Part 2) Location: Room 106 Reverb? Reverb. Are you looking for reverbs? Wait. Okay, okay. Okay. If this is where it has to happen, at the EMC Europe 2025 conference, this is where it has to happen, in this very workshop. We are not letting you go without learning about the well-known reverberation chambers, the statistical methods used to evaluate fields inside them, their theory and applications. How about that? This is our specialty. You know, we were good in the laboratories. But we came here, and we have prepared a workshop, but not alone. We have with us speakers from different areas of expertise regarding reverberation chambers, all from different institutes. And now, we just… are ready! Today, our little workshop, our presentations, and our live demonstrations using a Vibrating Intrinsic Reverberation Chamber (VIRC) have a big day. A very, very big day. But so far, it is not complete, it isn’t nearly close to being in the same vicinity as complete, because we have not shared it with you… yet. We cannot wait for you to witness the presented theory in action, and even participate in performing some of the experiments yourself. We live in an EMC world, a reverberating world, and we work with many people who specialize in this field… We have them with us. We are just waiting for you! Made possible with support of NEPIT. |
11:00am - 12:30pm | EMC Standard Evolution: Aeronautic vs. Automotive (Part 2) Location: Room 107 This workshop introduce the issues at the level of standards and norms introduced by new technologies within Aeronautical and Automotive transport, in particular with the introduction of electric and hybrid propulsion systems. Indeed, standards must be able to ensure the safety of users by proposing EMC tests that allow the use of future transport in the best possible conditions. For example, with the arrival of the electrification of propulsion in aeronautics and the generalization of power chains, new challenges appear on the control of crosstalk, conducted emissions generated by increasingly high switching frequencies or radiated fields with regard to exposure to waves of the human body. However, on this last subject, the automotive sector has long worked on a normative framework to ensure the safety of people when using electric or hybrid cars. Another example is the arrival of autonomous cars that no longer require human intervention for driving. The automotive regulatory framework will also have to take into account more stringent constraints to ensure passenger safety during journeys, potentially leading it towards constraints close to the aeronautical field. Through these two examples, we can easily understand that the two fields can evolve together and in a coordinated manner to benefit from the work of each. At the end of this workshop, a slot will be dedicated to an exchange on the subject with the audience. The workshop is divided into topics as: Standard, Nom, EMI, Susceptibility, Emissivity, Crosstalk, Human exposure, Shielding Effectiveness Measurands. The workshop will help the audience to properly test and design systems and their equipment for product EMC. Targeted Audience: • Primary: EMC test engineers in electric and electronic product industries • Secondary: Power Electronics designers, Systems designers, Harness designers; EMC researchers. |
11:00am - 12:30pm | Practical Applications of Modern Stochastic Simulation and Modelling (Part 1) Location: Room 108 Various stochastic simulation methods have recently matured to deliver uniquely efficient solutions for complex and uncertain electromagnetic field and circuit-level problems but very few EMC and SIPI engineers are actively using them yet. This workshop will review the technical foundations of such stochastic methods but focus more specifically on demonstrating practical applications of today’s stochastic simulation tools and modelling methodologies, highlighting the compelling reasons why they should be used. Stochastic simulation methods may address the uncertainty in 3D enclosure fields (e.g., reverberation chambers). They may address uncertainties in CE / CS of multiconductor cable assemblies. Or they may use statistical wave physics modelling for RE / RS performance of in-situ coupled cable-cavity field systems. Candidate stochastic simulation methods include (but are not limited to):
The most recent advances in these stochastic simulation methods have provided new, simpler wave power solutions to previously intractable problems. They provide more robust quantification of uncertainty than empirical margins, and they have used statistically reduced order formulations to solve 10+ GHz EMC problems 1000x faster than deterministic, numerical models. Together, these innovations begin to make simulation-based design for EMC and SIPI truly possible. This Workshop will demonstrate the newly available solutions for important practical design applications, such as
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11:00am - 12:30pm | Advances and Challenges in Active EMI Filters for Next-Generation Power Electronics (Part 2) Location: Room 109 The rapid evolution of power electronics in various domains, including automotive, aerospace, and industrial applications, has brought electromagnetic compatibility (EMC) challenges to the forefront of design considerations. The conventional Electromagnetic Interference (EMI) mitigation techniques pose various constraints and to overcome these challenges, Active EMI Filters (AEFs) are gaining popularity. This workshop presents a unique opportunity to explore cutting-edge developments in Active EMI Filters (AEFs), a technology poised to revolutionize EMC solutions across multiple industries. Leading experts from renowned companies and research institutions will present their latest findings and innovations in both digital and analog AEF (DAEF and AAEF) technologies. At the forefront of the workshop, the presenters will provide insights into the general working principles of DAEF and AAEF. The workshop will cover various topics, ranging from fundamental principles to stability analysis to practical implementations in high-power applications. Moreover, some potential areas of improvement in these technologies for implementation in a variety of applications will be discussed as well. Attendees will gain insights into assessing system parameter’s impact on AEF performance in automotive eDrives, stability analysis techniques for optimizing insertion loss, and the latest trends in three-phase AC and DC motor drives. In the domain of Active Filtering, the real world applications and the placement of components in high power applications is overlooked. The presenters will showcase the implications of various system parameters on the performance evaluation of AEFs. Moreover, the challenges that hinder the implementation of DAEFs or AAEFs in various applications (aerospace, industrial and automotive) will be presented. The workshop also aims at showcasing advancements in standalone AEF ICs, offering reduced and cost optimized system solutions. Furthermore, it will explore the potentials of digital active filters for common mode EMI suppression in power electronic systems, providing a comparative analysis with traditional methods and outlining future development paths. A special focus will be given to the constraints and opportunities for high-power (50 kW) AEFs in aeronautical applications, addressing the critical need for weight reduction and cost-effective EMI solutions in aircraft electrification. By bringing together diverse perspectives from industry leaders and researchers, this workshop aims to encourage collaboration and drive innovation in AEF technology. Participants will have the opportunity to engage in discussions on overcoming current limitations, exploring new applications, and shaping the future of EMC solutions for nextgeneration power electronics. Active EMI Filtering is a growing field which addresses the ever-growing challenge of introducing sophisticated solutions. Presenting this topic at the conference will provide attendees with actionable insights and the presenters can also benefit from it, since variety of ideas will be discussed/shared during an open Q&A session. This workshop is an essential event for EMC specialists, power electronics engineers, and researchers looking to stay at the forefront of AEF technology and its transformative potential across various industries. |
12:30pm - 2:20pm | Lunch Location: Restaurants nearby |
2:20pm - 3:50pm | Automotive EMC (Part 3) Location: Auditorium Automotive electric / electronic systems are endlessly growing in complexity with a permanent constraint of a constant or reduced time-to-market. Therefore, there is a strong need to improve constantly the efficiency of the EMC related tasks throughout the entire development process, starting from the design phase until the full-vehicle validation phase. This workshop intends to present an overview of the most recent industrial and academic advances in the field of automotive EMC design, modeling and simulation as well as in the field of automotive standards, testing and measurements. The presentations in this workshop will cover EMC issues at system, sub-system, equipment, and component levels. In particular, topics addressed by the speakers will include hybrid power-train systems EMC analysis, antenna implementation, equipment design, advanced testing techniques, printed-circuit-board optimization, and electric/electronic component characterization. |
2:20pm - 3:50pm | Electromagnetic Compatibility Validation on Wide Band Gap Power Electronic Devices (Part 1) Location: Room 105 As SiC and GaN devices are more commonly integrated in today’s electronics, in addition to following the design rules, there is also a higher demand for investigating EMC due to the presence of fast switching of such devices, on an inter and intra-system level. This workshop will feature both theoretical presentations and practical live demonstrations, illustrating how, with the right tools (rather than costly accessories), one can quickly gain a deeper understanding of the DUT's characteristics and how to choose the appropriate components to ensure long-term EMC compliance. In addition to the discussions there will be a demonstration to show how test automation can support and ease the measurement and qualification process of semiconductors. The time advantage of using time domain test equipment derived from the power electronics loss evaluation will also be highlighted. Effects of appropriate dynamic range, bandwidth estimation, how the probe interacts with the DUT, what the possible propagation paths are, and how can the resulting spectra be influenced by choosing for example a multi-level topology or modulation schemes on the switching frequency will be discussed. This workshop will enable the participants to understand the cause and effects of design choices on EMI and how to select the most suitable measurement device and accessories to effectively analyze and qualify their power electronic devices and circuits through measurements. |
2:20pm - 3:50pm | Recent Advances about VIRC (Vibrating Intrinsic Reverberation Chambers) (Part 1) Location: Room 106 Over the last few years, the interest in vibrating intrinsic reverberation chambers (the so-called VIRCs) among both industrial and academic communities has been growing rapidly. These low-cost and movable chambers are increasingly perceived as a reverberation chamber offering different possibilities and potential compared to 'traditional' parallelepipedic ones, rather than merely another kind of reverberation chamber. Therefore, the time has come this year in Paris for the VIRC to stand on their own and organize the first workshop dedicated solely to this topic during an EMC Europe symposium! This half-day workshop will bring together: - A presentation on the genesis and history of VIRC by its inventor, Mr. Frank Leferink - Technical presentations showcasing recent advances in VIRC - Hands-on, demo, and interactive sessions with a small VIRC prototype |
2:20pm - 3:50pm | Risk-Based EMC (Part 1) Location: Room 107 The words “Risk” and “EMC” have become closely related in this last decade and they have been used in various contexts. Therefore, one can ask several questions. What is meant by Electromagnetic Risk? In which context has it been used? We will start with an exploration of the meaning of Risk, Resilience and Functional Safety. We will continue with an exploration of Stakeholders Experience |
2:20pm - 3:50pm | Practical Applications of Modern Stochastic Simulation and Modelling (Part 2) Location: Room 108 Various stochastic simulation methods have recently matured to deliver uniquely efficient solutions for complex and uncertain electromagnetic field and circuit-level problems but very few EMC and SIPI engineers are actively using them yet. This workshop will review the technical foundations of such stochastic methods but focus more specifically on demonstrating practical applications of today’s stochastic simulation tools and modelling methodologies, highlighting the compelling reasons why they should be used. Stochastic simulation methods may address the uncertainty in 3D enclosure fields (e.g., reverberation chambers). They may address uncertainties in CE / CS of multiconductor cable assemblies. Or they may use statistical wave physics modelling for RE / RS performance of in-situ coupled cable-cavity field systems. Candidate stochastic simulation methods include (but are not limited to):
The most recent advances in these stochastic simulation methods have provided new, simpler wave power solutions to previously intractable problems. They provide more robust quantification of uncertainty than empirical margins, and they have used statistically reduced order formulations to solve 10+ GHz EMC problems 1000x faster than deterministic, numerical models. Together, these innovations begin to make simulation-based design for EMC and SIPI truly possible. This Workshop will demonstrate the newly available solutions for important practical design applications, such as
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2:20pm - 3:50pm | EMC Simulation in Power Electronics (Part 1) Location: Room 109 Electromagnetic interference (EMI) is a significant challenge in power electronic systems, affecting their efficiency, reliability, and overall electromagnetic compatibility (EMC). Understanding EMI is therefore essential for designing robust and high-performance power electronic systems. Despite its subtleness, EMC simulation has matured to provide significant contributions to the EMC design for power electronics. This workshop provides a comprehensive overview of the EMC simulation of power electronic systems, covering circuit topologies, 3D modeling techniques, and recent progresses in the application of machine learning. Participants of the workshop will explore the challenges of modeling EMI in power electronics. The audience shall understand the goals and limits of different modeling approaches. Demonstrations of modeling approaches using circuit and 3D simulation, as well as applying machine learning for multi-objective optimization will be given. |
3:50pm - 4:20pm | Coffee Break Location: Patio |
4:20pm - 5:50pm | Automotive EMC (Part 4) Location: Auditorium Automotive electric / electronic systems are endlessly growing in complexity with a permanent constraint of a constant or reduced time-to-market. Therefore, there is a strong need to improve constantly the efficiency of the EMC related tasks throughout the entire development process, starting from the design phase until the full-vehicle validation phase. This workshop intends to present an overview of the most recent industrial and academic advances in the field of automotive EMC design, modeling and simulation as well as in the field of automotive standards, testing and measurements. The presentations in this workshop will cover EMC issues at system, sub-system, equipment, and component levels. In particular, topics addressed by the speakers will include hybrid power-train systems EMC analysis, antenna implementation, equipment design, advanced testing techniques, printed-circuit-board optimization, and electric/electronic component characterization. |
4:20pm - 5:50pm | Electromagnetic Compatibility Validation on Wide Band Gap Power Electronic Devices (Part 2) Location: Room 105 As SiC and GaN devices are more commonly integrated in today’s electronics, in addition to following the design rules, there is also a higher demand for investigating EMC due to the presence of fast switching of such devices, on an inter and intra-system level. This workshop will feature both theoretical presentations and practical live demonstrations, illustrating how, with the right tools (rather than costly accessories), one can quickly gain a deeper understanding of the DUT's characteristics and how to choose the appropriate components to ensure long-term EMC compliance. In addition to the discussions there will be a demonstration to show how test automation can support and ease the measurement and qualification process of semiconductors. The time advantage of using time domain test equipment derived from the power electronics loss evaluation will also be highlighted. Effects of appropriate dynamic range, bandwidth estimation, how the probe interacts with the DUT, what the possible propagation paths are, and how can the resulting spectra be influenced by choosing for example a multi-level topology or modulation schemes on the switching frequency will be discussed. This workshop will enable the participants to understand the cause and effects of design choices on EMI and how to select the most suitable measurement device and accessories to effectively analyze and qualify their power electronic devices and circuits through measurements. |
4:20pm - 5:50pm | Recent Advances about VIRC (Vibrating Intrinsic Reverberation Chambers) (Part 2) Location: Room 106 Over the last few years, the interest in vibrating intrinsic reverberation chambers (the so-called VIRCs) among both industrial and academic communities has been growing rapidly. These low-cost and movable chambers are increasingly perceived as a reverberation chamber offering different possibilities and potential compared to 'traditional' parallelepipedic ones, rather than merely another kind of reverberation chamber. Therefore, the time has come this year in Paris for the VIRC to stand on their own and organize the first workshop dedicated solely to this topic during an EMC Europe symposium! This half-day workshop will bring together: - A presentation on the genesis and history of VIRC by its inventor, Mr. Frank Leferink - Technical presentations showcasing recent advances in VIRC - Hands-on, demo, and interactive sessions with a small VIRC prototype |
4:20pm - 5:50pm | Risk-Based EMC (Part 2) Location: Room 107 The words “Risk” and “EMC” have become closely related in this last decade and they have been used in various contexts. Therefore, one can ask several questions. What is meant by Electromagnetic Risk? In which context has it been used? We will start with an exploration of the meaning of Risk, Resilience and Functional Safety. We will continue with an exploration of Stakeholders Experience |
4:20pm - 5:50pm | Practical Applications of Modern Stochastic Simulation and Modelling (Part 3) Location: Room 108 Various stochastic simulation methods have recently matured to deliver uniquely efficient solutions for complex and uncertain electromagnetic field and circuit-level problems but very few EMC and SIPI engineers are actively using them yet. This workshop will review the technical foundations of such stochastic methods but focus more specifically on demonstrating practical applications of today’s stochastic simulation tools and modelling methodologies, highlighting the compelling reasons why they should be used. Stochastic simulation methods may address the uncertainty in 3D enclosure fields (e.g., reverberation chambers). They may address uncertainties in CE / CS of multiconductor cable assemblies. Or they may use statistical wave physics modelling for RE / RS performance of in-situ coupled cable-cavity field systems. Candidate stochastic simulation methods include (but are not limited to):
The most recent advances in these stochastic simulation methods have provided new, simpler wave power solutions to previously intractable problems. They provide more robust quantification of uncertainty than empirical margins, and they have used statistically reduced order formulations to solve 10+ GHz EMC problems 1000x faster than deterministic, numerical models. Together, these innovations begin to make simulation-based design for EMC and SIPI truly possible. This Workshop will demonstrate the newly available solutions for important practical design applications, such as
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4:20pm - 5:50pm | EMC Simulation in Power Electronics (Part 2) Location: Room 109 Electromagnetic interference (EMI) is a significant challenge in power electronic systems, affecting their efficiency, reliability, and overall electromagnetic compatibility (EMC). Understanding EMI is therefore essential for designing robust and high-performance power electronic systems. Despite its subtleness, EMC simulation has matured to provide significant contributions to the EMC design for power electronics. This workshop provides a comprehensive overview of the EMC simulation of power electronic systems, covering circuit topologies, 3D modeling techniques, and recent progresses in the application of machine learning. Participants of the workshop will explore the challenges of modeling EMI in power electronics. The audience shall understand the goals and limits of different modeling approaches. Demonstrations of modeling approaches using circuit and 3D simulation, as well as applying machine learning for multi-objective optimization will be given. |
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