Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
Please note that all times are shown in the time zone of the conference. The current conference time is: 29th June 2025, 02:17:34am CEST
Electromagnetic Compatibility Validation on Wide Band Gap Power Electronic Devices (Part 2)
Time:
Friday, 05/Sept/2025:
4:20pm - 5:50pm
Location:Room 105
75 seats, Tower 44, 1st floor
Session Abstract
As SiC and GaN devices are more commonly integrated in today’s electronics, in addition to following the design rules, there is also a higher demand for investigating EMC due to the presence of fast switching of such devices, on an inter and intra-system level.
This workshop will feature both theoretical presentations and practical live demonstrations, illustrating how, with the right tools (rather than costly accessories), one can quickly gain a deeper understanding of the DUT's characteristics and how to choose the appropriate components to ensure long-term EMC compliance.
In addition to the discussions there will be a demonstration to show how test automation can support and ease the measurement and qualification process of semiconductors. The time advantage of using time domain test equipment derived from the power electronics loss evaluation will also be highlighted. Effects of appropriate dynamic range, bandwidth estimation, how the probe interacts with the DUT, what the possible propagation paths are, and how can the resulting spectra be influenced by choosing for example a multi-level topology or modulation schemes on the switching frequency will be discussed.
This workshop will enable the participants to understand the cause and effects of design choices on EMI and how to select the most suitable measurement device and accessories to effectively analyze and qualify their power electronic devices and circuits through measurements.
Presentations
4:20pm - 5:05pm
Considerations to reduce EMI when moving to WBG Devices
Xavier Cheng
Rohde & Schwarz
Did you wonder why everybody talks about SiC and GaN and how this affects your testing and EMC counter measures? This presentation will compare WBG to traditional Silicon devices and give an outline on the challenges related with these technologies. In addition EMC issues are severe but can easily be discovered by using an oscilloscope with accessories like (near field) probes and LISN’s. This presentation will show in theory and practice how FFT, Math and Mask Test provides deeper insights of the DUT right at your work bench. Finally the presentation will give an outline how test automation can support the overall development cycle from characterization to life cycle testing.
5:05pm - 5:50pm
EMC debugging and analysis at the work bench
Christian Reimer
Rohde & Schwarz
EMC issues are severe but can easily be discovered by using an oscilloscope with accessories like (near field) probes and LISN’s. This presentation will show in theory and practice how FFT, Math and Mask Tests provide deeper insights of the DUT right at your work bench.
