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Recent Developments in Near-Field Measurement and Its Applications in EMC (Part 2)
Time:
Friday, 05/Sept/2025:
11:00am - 12:30pm
Session Chair: Dr. Cheng Yang, Hamburg University of Technology, Germany Session Chair: Prof. DAVID POMMERENKE, Graz University of Technology IFE, Austria
Location:Room 105
75 seats, Tower 44, 1st floor
Session Abstract
With the growing demand for 6G communication, automotive technologies, and artificial intelligence, modern electronic systems require high power levels exceeding hundreds of kilowatts and ultra-high data transfer rates beyond hundreds of Gbps. These advancements pose significant challenges for electric and RF designs, particularly in addressing EMC (Electromagnetic Compatibility) issues. Near-field measurement has emerged as a cost-effective and practical solution for pre-testing and pre-certification, especially when full-wave modeling and simulation become impractical due to the complexity of real-world applications. This workshop will introduce and showcase recent advancements in near-field scanning, covering fundamental measurement principles,fast and adaptive scanning techniques, efficient data acquisition and near-field modeling methods, and their engineering applications in EMC. Attendees from both academia and industry will benefit from expert insights into smart scan, probe compensation, robotic automation, and machine learning, offering efficient, reliable, and scalable solutions for EMC challenges.
Presentations
11:00am - 11:30am
Optimizing near-field measurement time and accuracy using an adaptive measurement approach
