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Recent Developments in Near-Field Measurement and Its Applications in EMC (Part 1)
Time:
Friday, 05/Sept/2025:
9:00am - 10:30am
Location:Room 105
75 seats, Tower 44, 1st floor
Session Abstract
With the growing demand for 6G communication, automotive technologies, and artificial intelligence, modern electronic systems require high power levels exceeding hundreds of kilowatts and ultra-high data transfer rates beyond hundreds of Gbps. These advancements pose significant challenges for electric and RF designs, particularly in addressing EMC (Electromagnetic Compatibility) issues. Near-field measurement has emerged as a cost-effective and practical solution for pre-testing and pre-certification, especially when full-wave modeling and simulation become impractical due to the complexity of real-world applications. This workshop will introduce and showcase recent advancements in near-field scanning, covering fundamental measurement principles,fast and adaptive scanning techniques, efficient data acquisition and near-field modeling methods, and their engineering applications in EMC. Attendees from both academia and industry will benefit from expert insights into smart scan, probe compensation, robotic automation, and machine learning, offering efficient, reliable, and scalable solutions for EMC challenges.
Presentations
9:00am - 9:30am
Near Field Scanning, Probes and related method for solving EMC problems
David Pommerenke
Hamburg University of Technology, Germany
This talk gives an overview on the ability and limits of near field scanning and related methods. For example: How to analyze the data? How to only visualize the radiating fields? What are the challenges in scan speed, frequency range, probe design etc.
9:30am - 10:00am
Source Reconstruction Methods based on Near-Field Scanning
Xingchang Wei
Zhejiang University, China
In this talk, by using near-field scanning and the dynamic differential evolution algorithm, real and complex EMI sources are reconstructed using equivalent dipoles. Artificial intelligence networks are used to predict the near and far fields from an unknown EMI source.
10:00am - 10:30am
Adaptive Near-field Scanning and Probe compensation
Tim Claeys
KU Leuven (Katholieke Universiteit Leuven), Belgium
In this presentation, an overview will be given on the current state of the art of adaptive near- and far-field scanning for EMC applications developed by KU Leuven and UGhent. Probe compensation technique to enhance accuracy of EMC near-field scanning is also presented.
