Estimating Characteristic Parameters of the Field radiated by an EMI Source
Frank Sabath
Bundeswehr Research Institute for Protective Technologies and CBRN Protection, Germany
At the time of the risk analysis, the EMI source used by the attacker is largely unknown. When defining an EMI scenario, the probability of occurrence and performance parameters of EMI sources must be estimated from local conditions, such as accessibility, the attacker's resources, and the characteristic properties of the available technologies. This article presents a method that can be used to estimate characteristic parameters of the radiated field from the construction volume of a potential EMI interference source.
Extensive susceptibility analysis of a µC-servomotor chain to IEMI
Justin Sobas1, Antoine Duguet1,2, Geneviève Duchamp1, Tristan Dubois1
1Univ. Bordeaux, CNRS, Bordeaux INP, IMS, UMR 5218, F-33400 Talence, France; 2Thales SIX GTS France SAS, 4 Avenue des Louvresses, 92230 Gennevilliers, France
While robotic plays an increasing part in our society, environment of Intentional ElectroMagnetic Interference (IEMI) is growing. In general, a robot is composed of a set of sensors, actuators and integrated circuits. In this article we present a complete study of the EM susceptibility of a microcontroller (µC) and servomotor chain to IEMI. Direct Power Injection (DPI) method is used in order to carry out a precise analysis. The results are validated with the Bulk Current Injection (BCI) method. EMI injection in µC-servomotor chain induces a voltage shift of the high and low logic level at the output of the µC. To cover different types of attack, the servomotor operates in three modes: static, scan or off. Depending on the operating mode and the type of injection, CW or pulse, we show the possibility to vibrate servomotor, locking the scan in a defined position, taking control of the servomotor when it is on or off. Finally, we propose a classification of the IEMI impact by effect, duration and criticality at servomotor level.
Study on the damage effect of PIN limiter under high-power microwave injection
Ruxin Zheng1, Shiping Tang1,2, Zhongyuan Zhou1,2, Chengjie Li1
1Research Center for Electromagnetic Environmental Effects, Southeast University, China; 2Research Center for Electromagnetic Environmental Effects, Southeast University Suzhou Campus, China
The study investigates the damage modes of a limiter under high-power microwave (HPM) injection. Firstly, a limiter circuit was constructed, and high-power microwaves of different amplitudes and frequencies were injected into it. It was observed that as the frequency increased, the positive peak output voltage gradually reached saturation. Subsequently, a PIN diode model was established using Sentaurus-TCAD, and simulations were conducted under HPM injection. Based on thermoelectric theory, the temperature variation trend within the PIN diode over time was calculated and analyzed. Furthermore, the changes in internal field intensity and current density within the diode were studied. Finally, the voltage and current magnitudes at the diode anode during the first cycle were calculated, and the energy absorbed by the device was determined through integration. This work provides valuable reference for the microwave damage assessment of PIN limiters.
Dazzle Effect on Automatic Gain Control Circuits exposed to intentional RF pulsed interference
tom billaux1, jeremy raoult1, benjamin saggin1, patrick hoffmann2
1Institut d'electronique et des sciences (IES), Montpellier, France; 2CEA, Gramat, France
This study investigates the susceptibility of Automatic Gain Control (AGC) circuits to pulsed electromagnetic interference, focusing on the resulting dazzle time, which characterizes the duration of AGC disruption. Through experimental analysis and modeling, we identify internal AGC mechanisms, such as the error integrator and response asymmetry, that influence recovery dynamics. These insights contribute to optimizing Directed Energy Weapon (DEW) strategies for maximizing disruption efficiency in electronic systems.
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