Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
Please note that all times are shown in the time zone of the conference. The current conference time is: 25th Aug 2025, 12:10:03am CEST
Session Chair: Dr. Marco KLINGLER, Klingler International Consulting Services, France Session Chair: Dr. Tom Hartman, University of Twente, Netherlands, The
Location:Auditorium
497 seats, basement
Presentations
Experimental Study on the Effect of Grounding Conditions of DUT and Link-Partner of Automotive Ethernet 100BASE-T1 on BCI Test
Teppei Ikeda1, Yusuke Yano1,2, Koji Ichikawa2, Osami Wada2, Jianqing Wang1,2
1Nagoya Institute of Technology; 2Center for Future Communications Research, Nagoya Institute of Technology
Investigation and Modelling of Bulk Current Injection Setups with Shielded Cables and Different Terminal Conditions for Virtual Testing
Manuel Mikschl, Reinhard Stolle
Technical University of Applied Sciences Augsburg, Germany
RI Testing of the OBU Electronic Components and Vehicle-Level
Hyok Lee, Seung-Gon Park
KOREA AUTOMOTIVE TECHNOLOGY INSTITUTE, Korea, Republic of (South Korea)
Predicting Induced Voltage on PCB Traces in Radiated Immunity Tests with 2D simulators
Priscila Fernandez-Lopez, Kevin Loudiere, Marine Stojanovic, Frederic Lafon
