Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
Please note that all times are shown in the time zone of the conference. The current conference time is: 29th June 2025, 12:31:03am CEST
Experimental Study on the Effect of Grounding Conditions of DUT and Link-Partner of Automotive Ethernet 100BASE-T1 on BCI Test
Teppei Ikeda1, Yusuke Yano1,2, Koji Ichikawa2, Osami Wada2, Jianqing Wang1,2
1Nagoya Institute of Technology; 2Center for Future Communications Research, Nagoya Institute of Technology
The adoption of automotive Ethernet (100BASE-T1, 1000BASE-T1) with differential signaling over twisted-pair cables is growing. In the Bulk Current Injection (BCI) test, interconnecting electronic control units (ECUs) with different common-mode termination conditions can alter noise reflection and resonance, potentially impacting the immunity of a device under test (DUT) with non-intrinsic effects. Despite its significance, this issue remains underexplored, resulting in unclear electromagnetic compatibility (EMC) design methodologies. This study experimentally investigates the impact of changes in common-mode termination conditions on the immunity of the DUT by modifying the grounding conditions of the link partner (LP). Key results include instances where failures occur even when homogeneous DUTs pass standalone tests, shifts in failure frequencies due to changes in common-mode termination conditions. Additionally, there is a strong correlation between the failure frequencies, the reflection coefficient (S11), and common-mode voltage.
Investigation and Modelling of Bulk Current Injection Setups with Shielded Cables and Different Terminal Conditions for Virtual Testing
Manuel Mikschl, Reinhard Stolle
Technical University of Applied Sciences Augsburg, Germany
In this paper, bulk current injection (BCI) setups with shielded components in the frequency range from 100 kHz to 1 GHz are investigated and modelled. The focus is particularly on studying the influence of the housing geometry of the equipment under test (EUT) with regard to the coupling. It is shown that the geometry has a significant effect, especially at higher frequencies. These effects are then taken into account by means of an RLC equivalent circuit, with the component parameters being determined using a 3D simulation. This approach leads to a good agreement between the coupling model and the measurements for different geometries.
RI Testing of the OBU Electronic Components and Vehicle-Level
Hyok Lee, Seung-Gon Park
KOREA AUTOMOTIVE TECHNOLOGY INSTITUTE, Korea, Republic of (South Korea)
V2X communication technology is increasingly being utilized to enhance the driving stability of passengers and to advance autonomous driving technology.
To utilize V2Xcommunication technology, a vehicle requires a V2X communication device called an On-Board Unit (OBU).
If the OBU malfunctions due to external electromagnetic interference while driving, it can lead to traffic accidents. Therefore, Radiated Immunity (RI) verification for electromagnetic interference is essential.
In this paper, we configured an electromagnetic interference and V2X communication environment in an Absorber-Lined Shielded Enclosure (ALSE) chamber and conducted RI tests on both the electronic components and vehicle level of the OBU.
Predicting Induced Voltage on PCB Traces in Radiated Immunity Tests with 2D simulators
Priscila Fernandez-Lopez, Kevin Loudiere, Marine Stojanovic, Frederic Lafon
Valeo, France
This paper addresses the prediction of induced voltage on PCB traces during radiated immunity tests in an Absorber-Lined Shielded Enclosure (ALSE) as per ISO 11452-2, focusing on the [1–6] GHz frequency range. The number of applications operating in this frequency range is increasing rapidly, and small PCB structures such as traces, whose dimensions are close to the wavelengths of these applications’ frequencies, suffer from undesirable electromagnetic coupling that can lead to malfunction. A 2D simulation model for field to trace coupling is introduced, based on the Agrawal theory. The results are compared to the 3D simulation to validate the 2D model. The findings highlight the effectiveness and the simplicity of the 2D model for predicting radiated immunity performance.
