Conference Agenda

Session

Reliability, Ageing and Obsolescence in EMC

Time:

Tuesday, 02/Sept/2025:

4:20pm - 5:50pm

Session Chair: Prof. Davy Pissoort, KU Leuven, Belgium
Session Chair: Prof. Mohammed Ramdani, ESEO, France

Location: Room 105

75 seats, Tower 44, 1st floor

Presentations

Future Mobility Electromagnetic Reliability Study based on HPVC Degradation Evaluation with Electromagnetic Noise Analysis

Seokbae Moon¹, Byeongsoo Kim¹, Seungho Ahn¹, Youngduk Han¹, Hae Lyong Kim², Jae Sang Yoon²

¹Hyundai Motors Group, Korea, Republic of (South Korea); ²Korea Automotive Technology Institute, Republic of (South Korea)

EMC Filter Drift Induced by Thermal Aging : Efficient Source Identification and Component Level Accelerated Aging Test

Matthieu Laidet^1,2, Alexandre Boyer^2,3, Julien Gazave¹, Sonia Ben Dhia^2,3

¹EDF Power Networ Lab, France; ²LAAS CNRS, France; ³INSA Toulouse, France

Degradation Characteristics of EMI Suppression Film Capacitors Under Combined Electro-Thermal-Humidity Stress and Their Impact on EMI Filter Performance

Zhaoxin Wang¹, Bo Yao¹, Szymon Pasko², Xing Wei¹, Huai Wang¹, Pooya Davari¹

¹Aalborg University, Denmark; ²TE Connectivity, Switzerland

Investigation of Radiated EMI Evolution of High-power Density GaN-based Converter Under Short-circuit Accelerated Aging

Mohamed BELGUITH^1,2, Sonia ELOUED¹, Moncef KADI², Jaleleddine BEN HADJ SLAMA¹, Mahmoud HAMOUDA¹

¹LATIS- Laboratory of Advanced Technology and Intelligent Systems Université de Sousse, Ecole Nationale d’Ingénieurs de Sousse / Sousse, Tunisia; ²Université Rouen Normandie / ESIGELEC / IRSEEM , 76000 Rouen, France