Reliability, Ageing and Obsolescence in EMC
Time: Tuesday, 02/Sept/2025: 4:20pm - 5:50pm
Session Chair: Prof. Davy Pissoort, KU Leuven, Belgium
Session Chair: Prof. Mohammed Ramdani, ESEO, France
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Location: Room 105
75 seats, Tower 44, 1st floor
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Future Mobility Electromagnetic Reliability Study based on HPVC Degradation Evaluation with Electromagnetic Noise Analysis
Seokbae Moon1, Byeongsoo Kim1, Seungho Ahn1, Youngduk Han1, Hae Lyong Kim2, Jae Sang Yoon2
1Hyundai Motors Group, Korea, Republic of (South Korea); 2Korea Automotive Technology Institute, Republic of (South Korea)
EMC Filter Drift Induced by Thermal Aging : Efficient Source Identification and Component Level Accelerated Aging Test
Matthieu Laidet1,2, Alexandre Boyer2,3, Julien Gazave1, Sonia Ben Dhia2,3
1EDF Power Networ Lab, France; 2LAAS CNRS, France; 3INSA Toulouse, France
Degradation Characteristics of EMI Suppression Film Capacitors Under Combined Electro-Thermal-Humidity Stress and Their Impact on EMI Filter Performance
Zhaoxin Wang1, Bo Yao1, Szymon Pasko2, Xing Wei1, Huai Wang1, Pooya Davari1
1Aalborg University, Denmark; 2TE Connectivity, Switzerland
Investigation of Radiated EMI Evolution of High-power Density GaN-based Converter Under Short-circuit Accelerated Aging
Mohamed BELGUITH1,2, Sonia ELOUED1, Moncef KADI2, Jaleleddine BEN HADJ SLAMA1, Mahmoud HAMOUDA1
1LATIS- Laboratory of Advanced Technology and Intelligent Systems Université de Sousse, Ecole Nationale d’Ingénieurs de Sousse / Sousse, Tunisia; 2Université Rouen Normandie / ESIGELEC / IRSEEM , 76000 Rouen, France
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