Conference Agenda

Using 3D models for SI simulations of ESD protection devices and EMI filters

Jennifer Schütt, Preethi Subbaraju

Nexperia Germany GmbH, Germany

SEED Simulations for Optimal System-level ESD Protection

Sergej Bub

Nexperia Germany GmbH, Germany

System level simulations

Richard Sjiariel, Andreas Barchanski

DS Deutschland GmbH

Basics of conducted and radiated emissions for Power Printed Circuit Board (PPCB)

Jean Marc Dienot^1,2

1: Labceem, Université Toulouse - Paul Sabatier, France; 2: Laboratoire SIAME – Fédération IPRA, EA458, E2S UPPA

A behavioral model for conducted mode emission of electrical converters for the MEA

Noan Artaud^1,2

1: Laboratoire SIAME – Fédération IPRA, EA458, E2S UPPA; 2: Onera, DEMR, Toulouse, France

Oriented EMC simulations to design High-Power modules in Railway

Emmanuel Batista

Alstom Transport S.A., Séméac, France

Introduction to EMC in Power Electronics, EMI Filter Design Basics and Performance Evaluation for Power Electronics Applications

Daria Nemashkalo

University of Twente, Netherlands, The

DC-DC Converter as Educational and Research Platform

Sebastian Koj

Jade University of Applied Sciences

Aggregation of Conducted Emissions from Electronic Power Converters in Smart Grids

Leonardo Sandrolini, Mattia Simonazzi

University of Bologna

Pearson Random Walk: A Statistical Model for Aggregated EMI in Multi-Converter Systems

Erjon Ballukja

University of Twente, Netherlands, The

Emerging Filters for Time-Varying Power Electronics Applications

Tom Hartman

University of Twente, Netherlands, The

Filter Design for High-Speed Motor Drive Systems in Aerospace

Patrick Koch

University of Twente, Netherlands, The

Spark Length and Spark Resistance Characterization for Air Breakdown Simulation Validation

Yang Xu¹, Jennifer Kitaygorsky², David Pommerenke¹

1: Graz University of Technology, Austria; 2: Electro Magnetic Applications, Inc. USA

Opportunities to improve ESD protection simulation based on voltage-dependent dynamic model

Lucas Kemystetter^1,2, Fabrice Caignet¹, Guillaume Mejecaze², Alexandre Boyer¹, Frédéric Puybaret², François Ruffat¹

1: LAAS CNRS, France; 2: CEA GRAMAT, France

Temperature dependence of Harmonic Distortion on TVS Structures

Gregor Florian Böhm¹, Leonhard Petzel¹, Steffen Holland², David Johannes Pommerenke¹

1: Graz University of Technology, Austria; 2: Nexperia GmbH Germany

Efficient Approach for System-level ESD Simulation Including Secondary Discharge

Subin Jo¹, Jonghyuck Jung¹, Seungil Jeung¹, Sungjin Lee¹, Minsung Kim², Byungho Cho², Jaeyong Cho¹

1: Huwin, Korea, Republic of (South Korea); 2: SL corporation, Korea, Republic of (South Korea)

S-PEEC formulation for lightning current modeling in conductive plates : a parametric analysis

Danica Cvetkovic^1,2,3, Sébastien Lalléchère¹, Lionel Pichon², Pierre-Etienne Lévy³

1: Safran Tech, France; 2: GeePs - CentraleSupélec; 3: SATIE - ENS Paris Saclay

Validation of an EMT Model for Surge Protective Devices Against Triggered Lightning Field Data

Thomas Tsovilis¹, Alexandros Y. Hadjicostas¹, Georgios D. Peppas², Yijun Zhang³, Shaodong Chen⁴

1: Aristotle University of Thessaloniki, Greece; 2: Technical University of Crete, Greece; 3: Fudan University, China; 4: Institute of Tropical and Marine Meteorology, China

Experimental Investigation of the 8/20 μs Impulse Current Level that Causes Transient Voltage Suppressor Diodes to Fail

Niki Gkonou¹, George Peppas², Evangelos Petrou¹, Thomas Tsovilis¹

1: Aristotle University of Thessaloniki, Greece; 2: Technical University of Crete

Time Domain Modeling of Lightning Induced Disturbances in a Buried Shielded Cable

Nekhoul Bachir, Chikeur Hadjer

University of Jijel, Algeria

Future Mobility Electromagnetic Reliability Study based on HPVC Degradation Evaluation with Electromagnetic Noise Analysis

Seokbae Moon¹, Byeongsoo Kim¹, Seungho Ahn¹, Youngduk Han¹, Hae Lyong Kim², Jae Sang Yoon²

1: Hyundai Motors Group, Korea, Republic of (South Korea); 2: Korea Automotive Technology Institute, Republic of (South Korea)

EMC Filter Drift Induced by Thermal Aging : Efficient Source Identification and Component Level Accelerated Aging Test

Matthieu Laidet^1,2, Alexandre Boyer^2,3, Julien Gazave¹, Sonia Ben Dhia^2,3

1: EDF Power Networ Lab, France; 2: LAAS CNRS, France; 3: INSA Toulouse, France

Degradation Characteristics of EMI Suppression Film Capacitors Under Combined Electro-Thermal-Humidity Stress and Their Impact on EMI Filter Performance

Zhaoxin Wang¹, Bo Yao¹, Szymon Pasko², Xing Wei¹, Huai Wang¹, Pooya Davari¹

1: Aalborg University, Denmark; 2: Schaffner

Investigation of Radiated EMI Evolution of High-power Density GaN-based Converter Under Short-circuit Accelerated Aging

Mohamed BELGUITH^1,2, Sonia ELOUED¹, Moncef KADI², Jaleleddine BEN HADJ SLAMA¹, Mahmoud HAMOUDA¹

1: LATIS- Laboratory of Advanced Technology and Intelligent Systems Université de Sousse, Ecole Nationale d’Ingénieurs de Sousse / Sousse, Tunisia; 2: Université Rouen Normandie / ESIGELEC / IRSEEM , 76000 Rouen, France

Real-time jammer localization inside a building based on a machine learning approach

Paul Monferran¹, Jonathan Villain¹, Antonio Costanzo², Artur Nogueira de São José³, Virginie Deniau¹, Christophe Gransart¹

1: Université Gustave Eiffel, France; 2: CERADE, ESAIP, France; 3: University of Brasilia, Faculty of Technology, Department of Electrical Engineering, Brazil

Methodology for Studying a Localized and Non-Intrusive Pulsed Current Injection on an Active Powered System

Léo DURAND^1,2, Tristan DUBOIS², Jean-Michel VINASSA², Guillaume MEJECAZE¹, Laurine CUROS¹, Frédéric PUYBARET¹

1: CEA, DAM, CEA-Gramat F-46500, France; 2: IMS laboratory, CNRS UMR 5218, University of Bordeaux, 33405 Talence, France

A Frequency-Domain Technique to Verify the Equivalent Area of a D-dot Sensor

Damien Gapillout¹, Theo Batista¹, Bertrand Daout², Marc Sallin²

1: CEA DAM Gramat, France; 2: Montena Technology, Switzerland

Protecting Sensors from IEMI: Shielding, Absorbers, and Mitigation Techniques

Louis Cesbron Lavau¹, Michael Suhrke¹, Marian Lanzrath¹, Peter Knott^2,3

1: Fraunhofer INT, Germany; 2: Fraunhofer FHR, Germany; 3: RWTH Aachen, Germany

Human Occupancy Estimation with Human Body Mie Scattering Model in Reverberant Environments

Kashan Alidjan, Jean-Paul Linnartz, Hans-Jürgen Hartmann, Ramiro Serra

Eindhoven University of Technology, Netherlands, The

Full-Body vs. Head-Only Modeling: Full Wave Computational SAR and Adaptation of Corresponding ANN Models

Hamideh Esmaeili, Cheng Yang, Christian Schuster

Hamburg University of Technology, Germany

EM Environment Through Different Lenses: ICU Room Measurements with Different Strategies

Sebastian Mauricio Salas Laurens¹, Bärbel van den Berg-de Bakker², Anne Roc'h¹

1: Eindhoven University of Technology, Netherlands, The; 2: Medisch Spectrum Twente, Netherlands, The

Estimation of CM Input Impedance of a Structure Containing Medical Wearable Devices on Saline

Mohammad Khorramizadeh, Sander Bronckers, Anne Roc'h

Eindhoven University of Technology, Netherlands, The

Localizing Harmonics Source On Large Conductor Based on Near-field Scanning

Rui Mi¹, Mehdi Gholizadeh¹, Jin Min², David David Pommerenke¹

1: Graz University of Technology, Austria; 2: Amber Precision Instruments, USA

Weighted-Correlation Near-Field Scanning for Far-Field Radiation Source Identification

Yuting Xie, Ling Zhang, Da Li, Er-Ping Li

Zhejiang University, China

Investigating the Challenges of Near-Field to Far-Field Transformation at Low Frequencies in Electromagnetic Compatibility Testing

Sajjad Sadeghi¹, Mehdi Gholizadeh², Jin Min³, David Pommerenke⁴

1: TU GRAZ, Austria; 2: TU GRAZ, Austria; 3: Amber Precision Instruments, CA, USA; 4: TU GRAZ, Austria

Deep Learning-Assisted Phaseless Near-Field Transformation for Accelerating Near-Field Scanning

Dong-Hao Han¹, Xing-Chang Wei¹, Krzysztof Sieczkarek²

1: College of Information Science and Electronic Engineering, Zhejiang University, P. R. China; 2: EMC Laboratory, Lukasiewicz - Poznan Institute of Technology, Poland

Semiconductor-Focused Simulation Environment for Emitted Noise Sensitivity of MOSFET Parameters

Robert Kragl¹, Steffen Beushausen¹, Karl Oberdieck¹, Konstantin Spanos¹, Ingmar Kallfass²

1: Robert Bosch, Germany; 2: University of Stuttgart, Germany

Susceptibility to RFI of Monolithic GaN Current Sources

Filippo Carastro¹, Davide Lena², Franco Fiori¹

1: Politecnico di Torino, Italy; 2: STMicroelectronics, Italy

The Influence of Ionizing Radiation on the Electromagnetic Immunity of a Bandgap Reference

Nikolaus Juch¹, Alicja Michalowska-Forsyth¹, Daniel Kircher^1,2, Bernd Deutschmann¹

1: Institute of Electronics, Graz University of Technology, Austria; 2: Christian Doppler Laboratory for EMC Aware Robust Electronic Systems

Simulation of an IC Level Radiated Immunity Portable Transmitter Test

Aymen BEN SAADA, Renaud Gillon, Patricia Joris

Melexis Technologies N. V., Belgium

Challenges in the EMC Characterization of a CIS Camera Module for Medical and Consumer Applications

Patrick Wiesenhofer¹, Dominik Kreindl^1,2, Bernhard Weiss¹, Thomas Bauernfeind², Christian Stockreiter¹

1: ams OSRAM AG, Austria; 2: Institute of Fundamentals and Theory in Electrical Engineering, Graz University of Technology, Austria

EMC Analysis and Estimation Method in IoT Embedded System

Erica Burzi¹, Antea Perrotta², Laura Fabbri¹, Alessandro Pali¹

1: Seco Spa, Italy; 2: ANSYS Corp, Italy

Investigation on the Susceptibility to RFI of High-Voltage Current Sensors

Franco Fiori

Politecnico di Torino, Italy

A Combined Common Mode Choke and Transformer Component for Enhanced Miniaturization and Performance

Jianquan Lou¹, Alpesh Bhobe², Haiwen Lu¹

1: Cisco System (China) R&D Co. Ltd.; 2: Cisco Systems, Inc.

Immunity of pacemakers near high power systems at 85 kHz

Chaïma Elharti^1,2,3, Lucien Hammen⁴, Mohamed Bensetti^1,2, Lionel Pichon^1,2, Den Palessonga^1,2,3

1: Laboratoire de Génie Electrique et Electronique de Paris (GeePs), Sorbonne Université, CNRS, 75252, Paris, France; 2: Laboratoire de Génie Electrique et Electronique de Paris (GeePs), Université Paris-Saclay, CentraleSupélec, CNRS, 91192, Gif-sur-Yvette, France; 3: ESME Research Lab, 94200, Ivry-sur-Seine, France; 4: Laboratoire d’Electromagnétisme, Vibrations et Optique, Institut national de recherche et de sécurité (INRS), Vandoeuvre-lès-Nancy, France

Influence of Chassis Materials and Human Postures on the EMF Safety of a Dynamic-WPT System for Automotive Applications

Valerio De Santis¹, Wassim Boumerdassi¹, Tommaso Campi², Mauro Feliziani¹

1: University of L'Aquila, Italy; 2: Sapienza University of Rome, Italy

Laboratory WPT3 11kW Wireless Power Transfer System compliant to IEC 61980 Class B H-Field Limits based on Reference Designs

Maximilian Hollenbach, Christian Koker

ifak - Institut für Automation und Kommunikation e. V.

Multi-objective Optimization of a WPT System for UAVs

Mohammed TERRAH^1,2,3, Mostafa-Kamel SMAIL^1,2,3, Lionel PICHON^1,2, Mohamed BENSETTI^1,2, Abdelhak GOUDJIL³

1: Université Paris-Saclay, CentraleSupélec, CNRS, Group of electrical and electronic engineering of Paris (GeePs); 2: Sorbonne Université, CNRS, Group of electrical and electronic engineering of Paris (GeePs); 3: Institut Polytechnique des Sciences Avancées Paris (IPSA)

A Method for Harmonic Noise Reduction Using Reflected Impedance in Wireless Power Transfer Systems

Changmin Lee, Jaewon Rhee, Seongho Woo, Seungmin Ha, Seungyoung Ahn

Korea Advanced Institute of Science and Technology, Korea, Republic of (South Korea)

PCB Resonators Characterization for Shielding Purposes in DWPT systems

Nunzia Fontana, Sami Barmada, Junda Zhu, Samuele Luterotti

University of Pisa, Italy

High Frequency Characterization of Dynamic Wireless Power Transfer Coils for EVs

Wassim Boumerdassi¹, Silvano Cruciani², Giorgio Di Nunzio¹, Alessio Sciamanna¹, Tommaso Campi³, Francesca Maradei³, Mauro Feliziani¹

1: Università of L'Aquila, Italy; 2: Tor Vergata University of Rome, Italy; 3: Sapienza University of Rome, Italy

Reducing Magnetic Fields in EV Wireless Charging with Resonant Shielding Coils

Emir Sulejmani, Florian Steinle, Michael Beltle, Stefan Tenbohlen

University of Stuttgart, Germany

Quantum Computational Methods for Higher Order Modes Detection in Transmission Lines

Emanuel Colella^1,2, Luca Bastianelli¹, Valter Mariani Primiani¹, Franco Moglie¹, Gabriele Gradoni¹

1: Università Politecnica delle Marche, Marche, Italy; 2: University of Surrey, Guildford, UK

Comparative Analysis of Hierarchical Matrix Formats for Electromagnetic Device Modeling: A Preliminary Study

Francesco Lucchini, Riccardo Torchio

University of Padova, Italy

Broadband Equivalent-Circuit for Microstrip Structures Based on Dyadic Green's Functions

Phillip Schulz, Marco Leone

Otto-von-Guericke University Magdeburg, Germany

{An Inherently Stable Modal Approach for Incorporating Debye-Modeled Dispersion in FEM-Based Broadband Circuit Models

Chris-Marvin Hamann, Marco Leone

Otto-von-Guericke-Universitaet Magdeburg, Germany

Targeted EMC Analysis Using a Novel Characteristic Mode Analysis Approach

Hannes Schreiber, Philipp Herwigk, Marco Leone

Otto-von-Guericke University Magdeburg, Germany

Near Field Scanning, Probes and related method for solving EMC problems

David Pommerenke

Hamburg University of Technology, Germany

Source Reconstruction Methods based on Near-Field Scanning

Xingchang Wei

Zhejiang University, China

Adaptive Near-field Scanning and Probe compensation

Tim Claeys

KU Leuven (Katholieke Universiteit Leuven), Belgium

Optimizing near-field measurement time and accuracy using an adaptive measurement approach

Sebastien Serpaud¹, Alexandre Boyer²

1: IRT Saint Exupéry, France; 2: University of Toulouse, France

Robotic Near-field Acquisition using On-the-fly Scan Technique

Cheng Yang

Hamburg University of Technology, Germany

EMC in Power Electronics – Part 1

Tom Hartman, Erjon Ballukja, Niek Moonen

University of Twente

EMC in Power Electronics – Part 2

Erjon Ballukja, Tom Hartman, Niek Moonen

University of Twente

Considerations to reduce EMI when moving to WBG Devices

Xavier Cheng

Rohde & Schwarz

EMC debugging and analysis at the work bench

Christian Reimer

Rohde & Schwarz