Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

Please note that all times are shown in the time zone of the conference. The current conference time is: 29th June 2025, 02:10:59am CEST

 
 
Session Overview
Date: Friday, 05/Sept/2025
8:30am
-
9:00am
Registration
Location: Patio
9:00am
-
10:30am
Automotive EMC (Part 1)
Location: Auditorium
 
9:00am - 9:30am

Modeling of Conducted Emission Tests of EV On-Board Powertrain Chargers on Table and on Vehicle – Discussions on the Correlation Between Test Results

Marco Klingler1, Abdelhak Benali2, Jérôme Mollet3

1: Klingler International Consulting Services (Courtesy of Stellantis), France; 2: Dassault Systèmes, France; 3: Dassault Systèmes, France



9:30am - 10:00am

Managing Excessive Risks That Can be Caused by EMI (even when all EMC tests are passed)

Keith Armstrong

Cherry Clough Consultants Ltd, UK



10:00am - 10:30am

Designing and Troubleshooting High-Power ECUs for Modern EVs

Min Zhang

Mach One Design, UK

Recent Developments in Near-Field Measurement and Its Applications in EMC (Part 1)
Location: Room 105
 
9:00am - 9:30am

Near Field Scanning, Probes and related method for solving EMC problems

David Pommerenke

Hamburg University of Technology, Germany



9:30am - 10:00am

Source Reconstruction Methods based on Near-Field Scanning

Xingchang Wei

Zhejiang University, China



10:00am - 10:30am

Adaptive Near-field Scanning and Probe compensation

Tim Claeys

KU Leuven (Katholieke Universiteit Leuven), Belgium

You Had Me at “Reverb…”! (Part 1)
Location: Room 106
 
9:00am - 9:30am

Reverberation Chambers: Introduction, Basic Theory, Uses and Applications

Ramiro Serra

Eindhoven University of Technology



9:30am - 10:00am

Fast and Reproducible Radiated Emission Measurements using the VIRC

Frank Leferink

University of Twente - Thales, Netherlands, The



10:00am - 10:30am

EMC Standard Testing in RCs

Vignesh Rajamani

Rohde & Schwarz

EMC Standard Evolution: Aeronautic vs. Automotive (Part 1)
Location: Room 107
 
9:00am - 9:30am

Introduction to EMC standard evolution from Aeronautic and Automotive point of view

Vincent MELCHOR1, Frédéric LAFON2, Charles JULLIEN3

1: SafranTech, France; 2: VALEO, France; 3: Safran Electrical & Power, France



9:30am - 10:00am

Main ongoing evolutions in EMC immunity automotive standardization and induced challenges

Rémy PERROT1, Frédéric LAFON2, Xavier BUNLON3

1: UTAC, France; 2: Valeo, France; 3: AMPERE, France



10:00am - 10:30am

Megatrends in Automotive and their impacts on future standardization

Frédéric LAFON1, Rémy PERROT2, Xavier BUNLON3

1: Valeo, France; 2: UTAC, France; 3: AMPERE CARS, France

Machine Learning in EMC: a Potential Compatibility
Location: Room 108
 
9:00am - 9:30am

From EM data to the ML model: best practices to adopt.

Paul Monferran1, Jonathan Villain1, Susana Naranjo-Villamil2

1: Université Gustave Eiffel, France; 2: EDF Power Networks Lab, EDF Group, Moret-Loing-et-Orvanne, 77250, France



9:30am - 10:00am

Machine Learning for lightning protection in power plants

Susana Naranjo-Villamil1, Paul Monferran2, Jonathan Villain2

1: EDF Power Networks Lab, EDF Group, Moret-Loing-et-Orvanne, 77250, France; 2: Université Gustave Eiffel, France

Advances and Challenges in Active EMI Filters for Next-Generation Power Electronics (Part 1)
Location: Room 109
 
9:00am - 9:22am

Principles and Challenges of AAEFs in Automotive Domain

Faryal Baig, Guido Rasek

Valeo eAutomotive Germany GmbH, Germany



9:22am - 9:44am

Stability analysis of active EMI filters

Stefan Tolle

Siemens AG, Germany



9:44am - 10:06am

Active EMI Filters in three-phase AC and DC motor drives

Hans Hoffmann Sathler, Rémy Caillaud

TE Connectivity (Schaffner), Switzerland



10:06am - 10:28am

Standalone Active EMI Filter (AEF) IC for Reduced System Solutions Size and Cost

Abhijeet Godbole, Naresh Adepu

Texas Instruments, India

10:30am
-
11:00am
Coffee Break
Location: Patio
11:00am
-
12:30pm
Automotive EMC (Part 2)
Location: Auditorium
 
11:00am - 11:30am

Test methods for Shaft noise and Shaft coupling attenuation in EV Motor/Inverter system

Hee-hoon Yi

Hyundai Motor Group, Korea



11:30am - 12:00pm

Establishing state-of-the-art material characterization laboratory and its applications in EMC simulation

Helin Zhou1, Mattias Ingvarson2, Anowar Masud3, Håkan Ringius4

1: Volvo Car Corporation, Sweden; 2: Volvo Car Corporation, Sweden; 3: Volvo Car Corporation, Sweden; 4: Volvo Car Corporation, Sweden



12:00pm - 12:30pm

EMC and EMF safety aspects of WPT systems in the automotive

Francesca Maradei1, Mauro Feliziani2, Tommaso Campi3, Silvano Cruciani4, Wassim Boumerdassi5, Valerio De Santis6

1: Sapienza Università di Roma, Italy; 2: Università degli Studi dell'Aquila, Italy; 3: Sapienza Università di Roma, Italy; 4: Università di Tor Vergata, Rome, Italy; 5: Università degli Studi dell'Aquila, Italy; 6: Università degli Studi dell'Aquila, Italy

Recent Developments in Near-Field Measurement and Its Applications in EMC (Part 2)
Location: Room 105
 
11:00am - 11:30am

Optimizing near-field measurement time and accuracy using an adaptive measurement approach

Sebastien Serpaud1, Alexandre Boyer2

1: IRT Saint Exupéry, France; 2: University of Toulouse, France



11:30am - 12:00pm

Robotic Near-field Acquisition using On-the-fly Scan Technique

Cheng Yang

Hamburg University of Technology, Germany

You Had Me at “Reverb…”! (Part 2)
Location: Room 106
 
11:00am - 11:30am

Fast Stirring, Fast Sensing and Direct Field-Strength Control

Mathias Magdowski1, Samuel Hildebrandt2

1: Otto-von-Guericke-University Magdeburg; 2: LUMILOOP



11:30am - 12:00pm

Shielding Measurements in Reverberation Chambers

Andy Marvin

University of York



12:00pm - 12:30pm

Reverberation Chambers for Testing Wireless Devices and Systems

Valter Mariani Primiani

Marche Polytechnic University

EMC Standard Evolution: Aeronautic vs. Automotive (Part 2)
Location: Room 107
 
11:00am - 11:30am

Challenges of designing HIRF & LIE robust equipment within the new mobility context

Thomas EUDES, Frédéric LAGO, Stéphane BLANC

Safran Electronics & Defense, France



11:30am - 12:00pm

Challenges in the qualification of HV aeronautical systems

Charles JULLIEN1, Jérôme GENOULAZ1, Coralie CHATARD1, Vincent MELCHOR2

1: Safran Electrical & Power, France; 2: SafranTech, France



12:00pm - 12:30pm

Round table on the topic with the audience

Charles JULLIEN1, Vincent MELCHOR2, Frédéric LAFON3, Thomas EUDES4, Rémy PERROT5, Xavier BUNLON6

1: Safran Electrical & Power, France; 2: SafranTech, France; 3: VALEO, France; 4: Safran Electronics & Defense, France; 5: UTAC, France; 6: AMPERE, France

Practical Applications of Modern Stochastic Simulation and Modelling (Part 1)
Location: Room 108
 
11:00am - 11:30am

Applications of Power Balance methods and stochastic EM method - from wireless applications to HIRF and IEMI evaluation in aircraft

Isabelle Junqua

ONERA, France



11:30am - 12:00pm

Co-simulation of 10+ Gbps Signal Integrity in a System-level EMI Environment

Paul Bremner

RobustPhysics, USA

Advances and Challenges in Active EMI Filters for Next-Generation Power Electronics (Part 2)
Location: Room 109
 
11:00am - 11:22am

Digital Active Filters for CM EMI of Power Electronic Systems

Sebastien Serpaud1, Gregory Almeida1, Richard Perraud2, Lea Pommier2, Davin Guedon2

1: IRT Saint Exupéry, France; 2: Airbus SAS, France



11:22am - 11:44am

Digital Active Filters for CM EMI of Power Electronic Systems

Stephan Frei, Tobias Dörlemann, Maximilian Lemke, Jens Aigner

TU Dortmund University, Germany



11:44am - 12:06pm

Constraints for a 50 kW Active EMI filter dedicated to aeronautical applications

Richard Perraud, Lea Pommier, Davin Guedon, Madalina Pascaru

Airbus SAS, France



12:06pm - 12:28pm

Examples and practical challenges of Active EMI Filters (AEF) in real power electronics products with power ratings of several kW or more power rating

Sangyeong Jeong, Jingook Kim

EMcoretech Inc., South Korea

12:30pm
-
2:20pm
Lunch
Location: Restaurants nearby
2:20pm
-
3:50pm
Automotive EMC (Part 3)
Location: Auditorium
 
2:20pm - 2:50pm

Estimation and improvements of signal integrity and immunity to EMI for automotive LAN

Hiroyuki Mori1, Noboru Maeda2, Miyuki Mizoguchi3, Ryo Watanabe4

1: SOKEN, Japan; 2: SOKEN, Japan; 3: SOKEN, Japan; 4: SOKEN, Japan



2:50pm - 3:20pm

Trends in EMC Simulation Standardization at the Society of Automotive Engineers of Japan (JSAE)

Soichiro Ota1, Kazuma Kawai2, Kazuki Furukawa3, Kento Shimizu4, Yasuo Matsubara5, Yuki Sato6, Umihiko Sawada7, Hiroyuki Mizutani8, Kengo Nakajima9

1: Toyota Motor Corporation, Japan; 2: DENSO, Japan; 3: AISIN, Japan; 4: AISIN, Japan; 5: DENSO TEN, Japan; 6: TokaiRika, Japan; 7: Hino Motor Corporation, Japan; 8: Hino Motor Corporation, Japan; 9: Mazda Motor Corporation, Japan



3:20pm - 3:50pm

Proximity Effects in Cable Simulations for Automotive EMC Virtual Testing

Alexander Demurov1, Ekaterina Yavolovskaya2, Iskander Badzagua3, Ilona Danelyan4, Anna Gheonjian5, Roman Jobava6

1: EMCoS LLC, Tbilisi, Georgia; 2: EMCoS LLC, Tbilisi, Georgia; 3: EMCoS LLC, Tbilisi, Georgia; 4: EMCoS LLC, Tbilisi, Georgia; 5: EMCoS LLC, Tbilisi, Georgia; 6: EMCoS LLC, Tbilisi, Georgia

Electromagnetic Compatibility Validation on Wide Band Gap Power Electronic Devices (Part 1)
Location: Room 105
 
2:20pm - 3:05pm

EMC in Power Electronics – Part 1

Tom Hartman, Erjon Ballukja, Niek Moonen

University of Twente



3:05pm - 3:50pm

EMC in Power Electronics – Part 2

Erjon Ballukja, Tom Hartman, Niek Moonen

University of Twente

Recent Advances about VIRC (Vibrating Intrinsic Reverberation Chambers) (Part 1)
Location: Room 106
 
2:20pm - 2:50pm

From a simple idea (or was it a mistake: you will hear the true story at the workshop), to many applications of the VIRC

Frank Leferink

University of Twente / Thales, Netherlands



2:50pm - 3:20pm

VIRC for Time-Varying Radiated Emissions Testing of SmallSats and Payloads

Marc Pous

HE Space for ESA, Noordwijk, Nehterlands



3:20pm - 3:50pm

How to assess (and increase !) the stirring process of your VIRC ?

Guillaume Andrieu1, Charles Jullien2

1: XLIM laboratory, University of Limoges, France; 2: Safran Electrical & Power, Toulouse

Risk-Based EMC (Part 1)
Location: Room 107
 
2:20pm - 2:50pm

Risk in the context of the EMC directive

Anne Roc'h

Eindhoven University of Technology, Netherlands, The



2:50pm - 3:20pm

From Risk-Based EMC to Electromagnetic Resilience: What is in a Name?

Davy Pissoort

KU Leuven, Bruges, Be



3:20pm - 3:50pm

Managing Functional Safety and Other Risks that can be Caused by EMI

Keith Armstrong

Cherry Clough Consultants, UK

Practical Applications of Modern Stochastic Simulation and Modelling (Part 2)
Location: Room 108
 
2:20pm - 2:50pm

Surrogate modeling and sensitivity analysis in circuit simulations

Karol Niewiadomski

University of Twente, Netherlands



2:50pm - 3:20pm

Lightning modeling and sensitivity analysis for EMC purposes

Arthur Piat, Victor Dos Santos, Sebastien Lallechere

SAFRAN, France



3:20pm - 3:50pm

Statistical Models of Power System for Low Voltage Profile Improvement

Robert Smoleński

University of Zielona Góra, Poland

EMC Simulation in Power Electronics (Part 1)
Location: Room 109
 
2:20pm - 2:40pm

Introduction to the conducted emission of power electronic circuits

Jan Hansen1,2,3

1: Institute of Electronics, Graz University of Technology, Austria; 2: Christian Doppler Laboratory for EMC Aware Robust Electronic Systems, Austria; 3: Silicon Austria Labs, Graz, Austria



2:40pm - 3:00pm

The Challenges of modeling the EMI of power electronics

Jan Hansen1,2,3

1: Institute of Electronics, Graz University of Technology, Austria; 2: Christian Doppler Laboratory for EMC Aware Robust Electronic Systems, Austria; 3: Silicon Austria Labs, Graz, Austria



3:00pm - 3:20pm

Passive and active component modeling

Jan Henninger1,2

1: Institute of Electronics, Graz University of Technology, Austria; 2: Christian Doppler Laboratory for EMC Aware Robust Electronic Systems, Austria



3:20pm - 3:50pm

System Modeling at low (f < 30 MHz) frequencies

Jan Henninger1,2

1: Institute of Electronics, Graz University of Technology, Austria; 2: Christian Doppler Laboratory for EMC Aware Robust Electronic Systems, Austria

3:50pm
-
4:20pm
Coffee Break
Location: Patio
4:20pm
-
5:50pm
Automotive EMC (Part 4)
Location: Auditorium
 
4:20pm - 4:50pm

Demystifying ECE Regulation 10: Technical requirements and R10.07 updates

Ayhan Gunsaya

Ford Motor Company, UK



4:50pm - 5:20pm

Review of Automotive EMC Standardisation With Focus on EV

Martin Wiles1, Mark Emery2

1: MVG, UK; 2: HORIBA MIRA, UK



5:20pm - 5:50pm

Early stage design of automotive EMC filter considering core power loss

Umberto Paoletti

Hitachi, Japan

Electromagnetic Compatibility Validation on Wide Band Gap Power Electronic Devices (Part 2)
Location: Room 105
 
4:20pm - 5:05pm

Considerations to reduce EMI when moving to WBG Devices

Xavier Cheng

Rohde & Schwarz



5:05pm - 5:50pm

EMC debugging and analysis at the work bench

Christian Reimer

Rohde & Schwarz

Recent Advances about VIRC (Vibrating Intrinsic Reverberation Chambers) (Part 2)
Location: Room 106
 
4:20pm - 4:50pm

Analysis of the Field Homogeneity and Isotropy in a Tent-Like Reverberation Chamber - Comparison of Using a Rotating Stirrer and Shaking the Walls

Mathias Magdowski

Otto-von-Guericke-Universität Magdeburg, Germany



4:50pm - 5:20pm

Anechoic measurements within a fully-stirred VIRC

Guillaume Andrieu

XLIM laboratory, University of Limoges, France



5:20pm - 5:50pm

Dual VIRC for shielding effectiveness measurements

Robert Vogt-Ardatjew1, Hans Schipper2

1: University of Twente, Enschede, The Netherlands; 2: Thales Nederland BV, Hengelo, The Netherlands

Risk-Based EMC (Part 2)
Location: Room 107
 
4:20pm - 4:50pm

Risk-Based EMC: Turning Complexity into Practical Solutions

Rob Kleihorst

Philips Medical Systems Nederland B.V.



4:50pm - 5:20pm

Risk-resilience-compliance framework for medical device EMC

Vikas Ashok Ghatge

KU Leuven, Bruges, BE



5:20pm - 5:50pm

Validation Plan and Physical Testing For EMR and Functional Safety

Marco KLINGLER

Klingler International Consulting Services, FR

Practical Applications of Modern Stochastic Simulation and Modelling (Part 3)
Location: Room 108
 
4:20pm - 4:50pm

Harnesses, cable modeling and stochastic EM

Charles Jullien

SAFRAN, France



4:50pm - 5:20pm

Random Dipole Model of Unintentional Radiators as a Tool for Emission Test Assessments

Jörg Petzold

Otto von Guericke University Magdeburg, Germany



5:20pm - 5:50pm

Role of correlations in RC measurement data

Ramiro Serra

Eindhoven University of Technology, Netherlands

EMC Simulation in Power Electronics (Part 2)
Location: Room 109
 
4:20pm - 4:50pm

System Modeling at high (f > 30 MHz) frequencies

Jan Hansen1,2,3

1: Institute of Electronics, Graz University of Technology, Austria; 2: Christian Doppler Laboratory for EMC Aware Robust Electronic Systems, Austria; 3: Silicon Austria Labs, Graz, Austria



4:50pm - 5:50pm

Application of Machine Learning in EMC modeling

Patrick Dominik Gsoels1,2,3

1: Silicon Austria Labs GmbH, Austria; 2: Christian Doppler Laboratory for EMC Aware Robust Electronic Systems, Austria; 3: Institute of Electronics, Graz University of Technology, Austria


 
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