Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

Session Overview
O_We_B_Room1: Statistics on EMC
Wednesday, 04/Sep/2019:
11:20am - 12:40pm

Session Chair: John Dawson
Location: Room 1

Show help for 'Increase or decrease the abstract text size'

Combining Kriging and Controlled Stratification to Identify Extreme Levels of Electromagnetic Interference

Thomas HOURET1,2, Philippe BESNIER1, Stéphane VAUCHAMP2, Philippe Pouliguen3

1INSA Rennes,CNRS,IETR, France; 2CEA DAM, Gramat, France; 3DGA, Paris, France

Statistical Analysis of MIL-STD-461 Emission Test Reports of Commercial Off-The-Shelf Products

Janne Petteri Pulkkinen

Finnish Defence Forces, Finland

Sensitivity Analysis of Microstrip Line Parameters on Total Radiated Power Through Surrogate Modelling

Florent DELAPORTE1,2, Philippe BESNIER1, Béatrice AZANOWSKY2

1IETR CNRS, France; 2Thales, France

Stochastic Analysis of Multi-Twisted Bundle of Twisted-Wire Pairs (MTB-TWP) Above Ground Plane With Random Non-uniform Twisting

Oussama Gassab1, Liang Zhou1, Wen-Yan Yin1,2

1Key Lab of Ministry of Education for the Design and EMC of High-Speed Electronic Systems, Shanghai Jiao Tong University, Shanghai 200240, China, China, People's Republic of; 2Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310058, China