Combining Kriging and Controlled Stratification to Identify Extreme Levels of Electromagnetic Interference
Thomas HOURET1,2, Philippe BESNIER1, Stéphane VAUCHAMP2, Philippe Pouliguen3
1INSA Rennes,CNRS,IETR, France; 2CEA DAM, Gramat, France; 3DGA, Paris, France
Statistical Analysis of MIL-STD-461 Emission Test Reports of Commercial Off-The-Shelf Products
Janne Petteri Pulkkinen
Finnish Defence Forces, Finland
Sensitivity Analysis of Microstrip Line Parameters on Total Radiated Power Through Surrogate Modelling
Florent DELAPORTE1,2, Philippe BESNIER1, Béatrice AZANOWSKY2
1IETR CNRS, France; 2Thales, France
Stochastic Analysis of Multi-Twisted Bundle of Twisted-Wire Pairs (MTB-TWP) Above Ground Plane With Random Non-uniform Twisting
Oussama Gassab1, Liang Zhou1, Wen-Yan Yin1,2
1Key Lab of Ministry of Education for the Design and EMC of High-Speed Electronic Systems, Shanghai Jiao Tong University, Shanghai 200240, China, China, People's Republic of; 2Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310058, China
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