Conference Agenda

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Session Overview
O_Th_A_Room2: Components, Semiconductors and IC (I)
Thursday, 05/Sep/2019:
9:00am - 10:40am

Session Chair: Mohamed Ramdani
Location: Room 2

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Enabling fast power integrity transient analysis through parameterized small-signal macromodels

Tommaso Bradde, Pedro Toledo, Marco De Stefano, Alessandro Zanco, Stefano Grivet-Talocia, Paolo Crovetti

Politecnico di Torino, Italy

Electromagnetic Compatibility in Leakage Current of CMOS Integrated Circuits

Zahra Abedi1, Sameer Hemmady1, Thomas Antonsen2, Edl Schamiloglu1, Payman Zarkesh-Ha1

1University of New Mexico, United States of America; 2University of Maryland, United States of America

Analysis of Re-radiated RF Harmonic Disturbance Caused by Integrated Circuit Input Pin Nonlinearity

Marko Magerl1, Christian Stockreiter1, Adrijan Baric2

1ams AG, Austria; 2University of Zagreb Faculty of Electrical Engineering and Computing, Croatia

Modifying Noise Source Amplitude Modulation Technique to Estimate Magnitude and Phase of Emissions from Individual Integrated Circuits

Kengo Iokibe, Shimpei Yoshino, Yusuke Yano, Yoshitaka Toyota

Okayama University, Japan

Destructive testing of electronic components based on absorption cross section RC measurements

Niklas Wellander, Mattias Elfsberg, Hanna Sundberg, Tomas Hurtig

Swedish Defence Research Agency, Sweden

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