Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

 
Session Overview
Session
O_We_C_Room3: Metrology on EMC (I)
Time:
Wednesday, 04/Sep/2019:
2:00pm - 3:20pm

Session Chair: Frédéric Pythoud
Location: Room 3

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Presentations

The Consequences of Missing Specification for Coupling-Decoupling Networks

Emrah Tas1, Frédéric Pythoud1, Dongsheng Zhao2

1Swiss Federal Institute of Metrology METAS, Switzerland; 2RHEA System B.V. for ESA, The Netherlands



A Testbed for Static Electricity Meter Testing with Conducted EMI

Helko E. van den Brom, Zander Marais, Dennis Hoogenboom, Ronald van Leeuwen, Gert Rietveld

VSL, Dutch Metrology Institute, The Netherlands



Low reflection and TEM mode preserving coaxial/non-coaxial adapting fixture

Wiktor Łodyga, Bartosz Chaber, Jan Sroka

Warsaw University of Technology, Poland



Waveform Characterization of Calibration-Pulse Generators for EMI Measuring Receivers

Marco A. Azpurua1, Marc Pous1, Ferran Silva1, Martin Hudlička2

1Universitat Politècnica de Catalunya; 2Czech Metrology Institute



 
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